Patents by Inventor Pauline A. Filipek

Pauline A. Filipek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5185809
    Abstract: A system for automatically determining the outline of a selected anatomical feature or region (e.g., in a slice of magnetic resonance data) and then making a quantitative determination of a morphometric parameter (such as area or volume) associated with the feature. A volumetric measurement of the feature is made by determining for each slice the areas within the outline for the feature and summing the areas for all the slices; the outlines are based on intensity contours, where the intensity of the contour is intermediate that within and outside of the feature; the intermediate intensity is chosen objectively based on a histogram of intensity levels; interpolation is used to assign contour locations in areas where the intensity of the contour is not present exactly; the accuracy of the outline is improved using an edge-optimization procedure in which the outline is shifted transversely to the location at which an estimate of the derivative (e.g.
    Type: Grant
    Filed: June 7, 1990
    Date of Patent: February 9, 1993
    Assignees: The General Hospital Corporation, Massachusetts Institute of Technology
    Inventors: David N. Kennedy, Pauline A. Filipek, Verne S. Caviness, Jr.
  • Patent number: 4961425
    Abstract: A system for automatically determining the outline of a selected anatomical feature or region (e.g., in a slice of magnetic resonance data) and then making a quantitative determination of a morphometric parameter (such as area or volume) associated with the feature. A volumetric measurement of the feature is made by determining for each slice the areas within the outline for the feature and summing the areas for all the slices; the outlines are based on intensity contours, where the intensity of the contour is intermediate that within and outside of the feature; the intermediate intensity is chosen objectively based on a histogram of intensity levels; interpolation is used to assign contour locations in areas where the intensity of the contour is not present exactly; the accuracy of the outline is improved using an edge-optimization procedure in which the outline is shifted transversely to the location at which an estimate of the derivative (e.g.
    Type: Grant
    Filed: September 25, 1987
    Date of Patent: October 9, 1990
    Assignee: Massachusetts Institute of Technology
    Inventors: David N. Kennedy, Pauline A. Filipek, Verne S. Caviness, Jr.