Abstract: Analog-digital converter configured for conversion of an input voltage, represented by a pair of input potentials, into a binary code using successive approximation. The analog-digital converter comprises a reference voltage generator (RVG) supplying a first pair of reference potentials and a second pair of reference potentials. The analog-digital converter further comprises a switched capacitor array (SCA) configured to receive the first and the second pair of reference potentials as well as a control unit (CTRL) coupled to the switched capacitor array (SCA) and configured to switch capacitors of the switched capacitor array (SCA) either to the first pair of reference potentials or to the second pair of reference potentials depending on a progress of the conversion.

Abstract: Analog-digital converter configured for conversion of an input voltage, represented by a pair of input potentials, into a binary code using successive approximation. The analog-digital converter comprises a reference voltage generator (RVG) supplying a first pair of reference potentials and a second pair of reference potentials. The analog-digital converter further comprises a switched capacitor array (SCA) configured to receive the first and the second pair of reference potentials as well as a control unit (CTRL) coupled to the switched capacitor array (SCA) and configured to switch capacitors of the switched capacitor array (SCA) either to the first pair of reference potentials or to the second pair of reference potentials depending on a progress of the conversion.

Abstract: The present invention provides a programmable modular circuit for testing and controlling a system-on-a-chip integrated circuit, and applications thereof. In an embodiment, the programmable modular circuit comprises a plurality of serial-to-parallel interface registers coupled together by a data line, a clock line, and an enable line. Each of the plurality of serial-to-parallel interface registers is coupled to a module of the system-on-a-chip. The data line and the clock line are used to serially clock data into the plurality of serial-to-parallel interface registers. Applying a first logical value to the enable line provides the data serially clocked into the plurality of serial-to-parallel interface registers to modules of the system-on-a-chip. Applying a second logical value to the enable line provides default values to modules of the system-on-a-chip.

Abstract: The present invention provides a programmable modular circuit for testing and controlling a system-on-a-chip integrated circuit, and applications thereof. In an embodiment, the programmable modular circuit comprises a plurality of serial-to-parallel interface registers coupled together by a data line, a clock line, and an enable line. Each of the plurality of serial-to-parallel interface registers is coupled to a module of the system-on-a-chip. The data line and the clock line are used to serially clock data into the plurality of serial-to-parallel interface registers. Applying a first logical value to the enable line provides the data serially clocked into the plurality of serial-to-parallel interface registers to modules of the system-on-a-chip. Applying a second logical value to the enable line provides default values to modules of the system-on-a-chip.