Patents by Inventor Paulo Jorge Furtado Correia

Paulo Jorge Furtado Correia has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6349588
    Abstract: A system and corresponding method for bulge testing films (e.g. thin films, coatings, layers, etc.) is provided, as well as membrane structures for use in bulge testing and improved methods of manufacturing same so that resulting membrane structures have substantially identical known geometric and responsive characteristics. Arrayed membrane structures, and corresponding methods, are provided in certain embodiments which enable bulge testing of a film(s) over a relatively large surface area via a plurality of different freestanding membrane portions. Improved measurements of film bulging or deflection are obtained by measuring deflection of a center point of a film, relative to non-deflected peripheral points on the film being tested. Furthermore, membrane structures are adhered to mounting structure in an improved manner, and opaque coatings may be applied over top of film(s) to be bulge tested so that a corresponding optical transducer can more easily detect film deflection/bulging.
    Type: Grant
    Filed: March 20, 2000
    Date of Patent: February 26, 2002
    Assignee: Exponent Inc.
    Inventors: Stuart B. Brown, Christopher L. Muhlstein, Kevin R. Lynch, Richard Mlcak, Paulo Jorge Furtado Correia
  • Patent number: 6321594
    Abstract: A system and corresponding method for bulge testing films (e.g. thin films, coatings, layers, etc.) is provided, as well as membrane structures for use in bulge testing and improved methods of manufacturing same so that resulting membrane structures have substantially identical known geometric and responsive characteristics. Arrayed membrane structures, and corresponding methods, are provided in certain embodiments which enable bulge testing of a film(s) over a relatively large surface area via a plurality of different freestanding membrane portions. Improved measurements of film bulging or deflection are obtained by measuring deflection of a center point of a film, relative to non-deflected peripheral points on the film being tested. Furthermore, membrane structures are adhered to mounting structure in an improved manner, and opaque coatings may be applied over top of film(s) to be bulge tested so that a corresponding optical transducer can more easily detect film deflection/bulging.
    Type: Grant
    Filed: March 20, 2000
    Date of Patent: November 27, 2001
    Assignee: Exponent, Inc.
    Inventors: Stuart B. Brown, Christopher L. Muhlstein, Kevin R. Lynch, Richard Mlcak, Paulo Jorge Furtado Correia
  • Patent number: 6050138
    Abstract: A system and corresponding method for bulge testing films (e.g. thin films, coatings, layers, etc.) is provided, as well as membrane structures for use in bulge testing and improved methods of manufacturing same so that resulting membrane structures have substantially identical known geometric and responsive characteristics. Arrayed membrane structures, and corresponding methods, are provided in certain embodiments which enable bulge testing of a film(s) over a relatively large surface area via a plurality of different freestanding membrane portions. Improved measurements of film bulging or deflection are obtained by measuring deflection of a center point of a film, relative to non-deflected peripheral points on the film being tested. Furthermore, membrane structures are adhered to mounting structure in an improved manner, and opaque coatings may be applied over top of film(s) to be bulge tested so that a corresponding optical transducer can more easily detect film deflection/bulging.
    Type: Grant
    Filed: October 22, 1997
    Date of Patent: April 18, 2000
    Assignee: Exponent, Inc.
    Inventors: Kevin R. Lynch, Richard Mlack, Paulo Jorge Furtado Correia, Stuart B. Brown, Christopher L. Muhlstein