Patents by Inventor Pavel A. Osipov

Pavel A. Osipov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210075812
    Abstract: The present invention relates to a system and a method for sequential anomaly revealing in a computer network. A method comprises the steps of receiving a log-file on activities of a user in the computer network; optional evaluation of each state in a session in a quarantine mechanism; multiple criteria evaluation of states of not quarantined states of the sessions or multi-state sessions in a session evaluation mechanism; and building and updating individual and group models. The system comprises a sequential anomaly revealing platform connected to the data hub and configured to reveal sequential anomalies in signals received from the data. The sequential anomaly revealing platform further comprises session evaluation and anomaly detection mechanism, individual and group models building and updating mechanisms, and optional multi-state transformation module and a quarantine module.
    Type: Application
    Filed: May 8, 2018
    Publication date: March 11, 2021
    Inventors: Pavels OSIPOVS, Aivars ROZKALNS, Arkadijs BORISOVS, Andrejs JERSOVS, Jurijs CIZOVS, Jurijs KORNIJENKO, Vitalijs ZABINAKO
  • Patent number: 7221458
    Abstract: Method of optical measuring the microrelief of an object using a modulation interference microscope. An input coherent monochromatic polarized light flux is split into an object light beam exposing the object and a reference beam. The light flux intensity is redistributed between the object and reference beams. Thereafter, polarization modulation is performed separately for the object beam and the reference beam. The polarized object beam is reflected onto the object plane to expose the object field. Amplitude modulation is performed by changing the intensity ratio between the object beam and the reference beam. A fraction of the light at a pixel caused by the object beam with respect to the total light falling on the pixel is determined.
    Type: Grant
    Filed: January 23, 2001
    Date of Patent: May 22, 2007
    Inventors: Vladimir A. Andreev, Konstantin V. Indukaev, Pavel A. Osipov
  • Patent number: 6778052
    Abstract: The invention relates to the precision machine manufacturing and can be used as a gear for creating an extra-precise linear drive in the machine-tool industry, metrology, optics and electronic industry. A contactless magnetic screw gear (CMSG) comprises a screw (1) and a nut (2) including a permanent magnet (3) mounted between magnetic circuits (14) having pole pieces (4). A fine-modular thread is made on the screw (1) and the pole pieces (4), grooves of which thread are filled with a solid non-magnetic material flush with tops of the thread ridges. The screw (1) and the nut (2) interact each other via a radial gap (11). According to the second variant of the CMSG, the nut is provided with a housing in which are mounted N double length magnetic circuits and N double length pole pieces separated from each other with the permanent magnets.
    Type: Grant
    Filed: June 2, 2003
    Date of Patent: August 17, 2004
    Assignee: Obschestvo S Ogranichennoy Otvetsvennostu <Laboratorii Amfora>
    Inventors: Konstantin V. Indukaev, Pavel A. Osipov
  • Publication number: 20040119984
    Abstract: The invention relates to optical engineering, in particular to methods for measuring a microrelief, the distribution of optical material constants of a near-surface layer and can be used for microelectronic engineering, nanotechnology, material science, medicine and biology. The aim of the invention is to improve spatial resolution for mearsuring geometrical parameters of the relief and the distribution of the optical material constants, extend the range of defined constants including optical anisotropy constants, significantly increasing the accuracy of definition of the material constant and extending the number of objects studied. The inventive method for measuring microrelief and optical characteristics of the near-surface layer and a modulation interference microscope for carrying out said method are also disclosed.
    Type: Application
    Filed: January 14, 2004
    Publication date: June 24, 2004
    Inventors: Vladimir A. Andreev, Konstantin V. Indukaev, Pavel A. Osipov