Abstract: A LIDAR system is provided. The LIDAR system comprises at least one processor configured to: control at least one light source in a manner enabling light intensity to vary over a scan of a field of view using light from the at least one light source; control at least one light deflector to deflect light from the at least one light source; obtain an identification of at least one distinct region of interest in the field of view; and increase light allocation to the at least one distinct region of interest relative to other regions, such that following a first scanning cycle, light intensity in at least one subsequent second scanning cycle at locations associated with the at least one distinct region of interest is higher than light intensity in the first scanning cycle at the locations associated with the at least one distinct region of interest.

Abstract: A LIDAR system is provided. The LIDAR system comprises at least one processor configured to: control at least one light source in a manner enabling light flux of at least one light source to vary over a plurality of scans of a field of view, the field of view including a near-field portion and a far-field portion; control at least one light deflector to deflect light from the at least one light source in a manner scanning the field of view; implement a first scanning rate for first frames associated with scanning cycles that cover the near-field portion and a second scanning rate for second frames associated with scanning cycles that cover the far-field portion; and control the at least one light source to alter a light source parameter and thereby project light in a manner enabling detection of objects in the second frames associated with the far-field portion.

Abstract: A LIDAR system is provided. The LIDAR system comprises at least one processor configured to: control at least one light source in a manner enabling light flux of at least one light source to vary over a plurality of scans of a field of view, the field of view including a near-field portion and a far-field portion; control at least one light deflector to deflect light from the at least one light source in a manner scanning the field of view; implement a first scanning rate for first frames associated with scanning cycles that cover the near-field portion and a second scanning rate for second frames associated with scanning cycles that cover the far-field portion; and control the at least one light source to alter a light source parameter and thereby project light in a manner enabling detection of objects in the second frames associated with the far-field portion.

Abstract: A LIDAR system is provided. The LIDAR system comprises at least one processor configured to: control at least one light source in a manner enabling light intensity to vary over a scan of a field of view using light from the at least one light source; control at least one light deflector to deflect light from the at least one light source; obtain an identification of at least one distinct region of interest in the field of view; and increase light allocation to the at least one distinct region of interest relative to other regions, such that following a first scanning cycle, light intensity in at least one subsequent second scanning cycle at locations associated with the at least one distinct region of interest is higher than light intensity in the first scanning cycle at the locations associated with the at least one distinct region of interest.

Abstract: Disclosed is a scanning device including: a photonic emitter assembly (PTX) to emit at least one pulse of inspection photons in accordance with at least one adjustable pulse parameter, a photonic reception and detection assembly (PRX) to receive reflected photons reflected back from an object, the PRX including a detector to detect in accordance with at least one adjustable detection parameter the reflected photons and produce a detected scene signal, and a closed loop controller to: (a) control the PTX and PRX, (b) receive the detected scene signal from the detector and (c) update said at least one pulse parameter and at least one detection parameter at least partially based on a work plan derived at least partially from the detected scene signal.

Abstract: Disclosed is a scanning device including a photonic emitter assembly (PTX) to emit at least one pulse of inspection photons in accordance with at least one adjustable pulse (generation) parameter, a photonic reception and detection assembly (PRX) to receive reflected photons reflected back from an object, the PRX including a dynamic detector to detect the reflected photons based on one or more adjustable detector parameter, the detector further configured to produce a detected scene signal, and a closed loop controller to control the PTX and PRX and to receive a PTX feedback and a PRX feedback, the controller further comprising a situational assessment unit to receive the detected scene signal from the detector and produce a scanning plan and update the at least one pulse parameter and at least one detector parameter at least partially based on the scanning plan.