Patents by Inventor Pavel Georgiyevich BARANOV

Pavel Georgiyevich BARANOV has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Characterization apparatus for characterizing scintillator material
    Patent number: 10101471
    Abstract: The invention relates to a characterization apparatus (1) for characterizing scintillator material (3) especially for a PET detector. A first radiation source (2) irradiates the scintillator material with first radiation (4) having a wavelength being smaller than 450 nm. Then, a second radiation source (5) irradiates the scintillator material with pulsed second radiation (6) having a wavelength being larger than 600 nm and having a pulse duration being equal to or smaller than 50 s, wherein a detection device (9) detects third radiation (12) from the scintillator material (3) during and/or after the irradiation by the second radiation. The third radiation depends on the amount of charge carriers trapped at electronic defects of the scintillator material such that it can be used as an indicator for the amount of electronic defects and hence for characterizing the scintillator material. This characterization can be performed relatively fast and in a relatively simple way.
    Type: Grant
    Filed: July 10, 2015
    Date of Patent: October 16, 2018
    Assignees: KONINKLIJKE PHILIPS N.V., IOFFE PHYSICAL TECHNICAL INSTITUTE
    Inventors: Herfried Karl Wieczorek, Cornelis Reinder Ronda, Hans-Aloys Wischmann, Pavel Georgiyevich Baranov, Gaik Asatrian, Danil Olegovich Tolmachev
  • CHARACTERIZATION APPARATUS FOR CHARACTERIZING SCINTILLATOR MATERIAL
    Publication number: 20170205515
    Abstract: The invention relates to a characterization apparatus (1) for characterizing scintillator material (3) especially for a PET detector. A first radiation source (2) irradiates the scintillator material with first radiation (4) having a wavelength being smaller than 450 nm. Then, a second radiation source (5) irradiates the scintillator material with pulsed second radiation (6) having a wavelength being larger than 600 nm and having a pulse duration being equal to or smaller than 50 s, wherein a detection device (9) detects third radiation (12) from the scintillator material (3) during and/or after the irradiation by the second radiation. The third radiation depends on the amount of charge carriers trapped at electronic defects of the scintillator material such that it can be used as an indicator for the amount of electronic defects and hence for characterizing the scintillator material. This characterization can be performed relatively fast and in a relatively simple way.
    Type: Application
    Filed: July 10, 2015
    Publication date: July 20, 2017
    Applicants: KONINKLIJKE PHILIPS N.V., IOFFE PHYSICAL TECHNICAL INSTITUTE
    Inventors: Herfried Karl WIECZOREK, Cornelis Reinder RONDA, Hans-Aloys WISCHMANN, Pavel Georgiyevich BARANOV, Gaik ASATRIAN, Danil Olegovich TOLMACHEV