Abstract: A method and associated systems for using wreath products and invariance groups to test a partially symmetric quantum-logic circuits. A test system receives information that describes the architecture of a quantum-logic circuit to be tested. The system uses this information to hierarchically organize the circuit's inputs into non-overlapping blocks. The system creates set of groups associated with the blocks, and then generates an invariance group that contains one or more invariant permutations of the inputs by computing a wreath product of the set of groups. These invariant permutations identify a minimal number of tests required to verify the circuit for all possible input vectors. The system then directs a test apparatus to perform the resulting optimized test sequence upon the circuit.

Abstract: A method and associated systems for predicting a degree of risk associated with a planned change to a computer server or other electronic component. A computerized change-management system receives Probability and Impact inputs derived from user-derived input, from which it determines a Baseline risk of change failure. The system processes mined data to determine an historic change-failure rate as a function of a type of change, and computes a predictive incident probability based on a predictive analytics engine's forecast of whether a particular type of server will be problematic. The system then computes a final Change Risk by adjusting the Baseline risk as a function of the historic change-failure rate, the predictive incident-probability, and a Baseline-specific weighting factor. If the resulting Change Risk is judged to be elevated, the system initiates collateral actions and notifications intended to reduce the probability and impact of a change failure.

Abstract: Systems and methods for optimized testing of partially symmetric quantum-logic circuits. A test system receives information that describes the architecture of a quantum-logic circuit to be tested. The system uses this information to organize the circuit's inputs into two or more mutually exclusive blocks of inputs. The system computes a wreath product of a set of groups associated with the blocks in order to generate an invariance group that contains one or more invariant permutations of the circuit's inputs. These invariant permutations can be used to reduce the number of tests required to fully verify the circuit for all possible input vectors. Once one specific input vector has been verified, there is no need to test other vectors that can be generated by performing any one of the invariant permutations upon the previously verified vector.