Patents by Inventor Peet Goedendorp

Peet Goedendorp has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11587762
    Abstract: The invention relates to a device and method for determining a property of a sample that is to be used in a charged particle microscope. The sample comprises a specimen embedded within a matrix layer. The device comprises a light source arranged for directing a beam of light towards said sample, and a detector arranged for detecting light emitted from said sample in response to said beam of light being incident on said sample. Finally, the device comprises a controller that is connected to said detector and arranged for determining a property of said matrix layer based on signals received by said detector.
    Type: Grant
    Filed: February 5, 2021
    Date of Patent: February 21, 2023
    Assignee: FEI Company
    Inventors: Maarten Kuijper, Matthijn Robert-Jan Vos, Ondrej Ludmil Shànël, Peet Goedendorp
  • Publication number: 20210257183
    Abstract: The invention relates to a device and method for determining a property of a sample that is to be used in a charged particle microscope. The sample comprises a specimen embedded within a matrix layer. The device comprises a light source arranged for directing a beam of light towards said sample, and a detector arranged for detecting light emitted from said sample in response to said beam of light being incident on said sample. Finally, the device comprises a controller that is connected to said detector and arranged for determining a property of said matrix layer based on signals received by said detector.
    Type: Application
    Filed: February 5, 2021
    Publication date: August 19, 2021
    Applicant: FEI Company
    Inventors: Maarten Kuijper, Matthijn Robert-Jan Vos, Ondrej Ludmil Shánel, Peet Goedendorp