Patents by Inventor Pei-Chen Hsieh

Pei-Chen Hsieh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • OAT-BASED LIQUID HAVING ENHANCED FOAMING AND WELL-BALANCED TASTE QUALITY PROPERTIES, AND IMMUNOMODULATORY EFFICACY, PROCESS FOR PREPARING THE SAME BY QUADRI-ENZYME HYDROLYSIS AND USE OF THE SAME
    Publication number: 20220338496
    Abstract: The present invention relates to an oligo-saccharide oat liquid composition, an oligo-saccharide oat powder composition and an oligo-saccharide oat drink having improved properties and immunomodulatory efficacy (for example, promotion of proliferation of immune cells), a micro-milling process involving quadri-enzyme hydrolysis for preparing the same, and uses thereof.
    Type: Application
    Filed: April 21, 2022
    Publication date: October 27, 2022
    Inventors: Kwan-Han CHEN, HUNG-CHI HSIAO, CHUN-LIANG CHOU, HAI-FENG CHANG, YI-SHIAN WANG, YUN-WEN CHEN, PEI-HSIU HUANG, PEI-CHEN HSIEH
  • Automatic production quality control method and system
    Patent number: 6766208
    Abstract: A method of controlling production quality of a wafer production line. The wafer production line includes a server having a database device, a plurality of manufacturing machines processing corresponding unit processes and a manufacturing executive system coupled to the server controlling the manufacturing machines. When the server determines that the wafers of the current lot do not comply with a predetermined specification, the manufacturing machines handling the wafers can be identified and the manufacturing executive system shuts down the identified manufacturing machines to calibrate parameters thereof. In addition, the wafers of the next lot are directly inspected to verify whether the identified manufacturing machines work well.
    Type: Grant
    Filed: August 2, 2002
    Date of Patent: July 20, 2004
    Assignee: Powerchip Semiconductor Corp.
    Inventor: Pei-Chen Hsieh
  • Automatic production quality control method and system
    Publication number: 20030060916
    Abstract: A method of controlling production quality of a wafer production line. The wafer production line includes a server having a database device, a plurality of manufacturing machines processing corresponding unit processes and a manufacturing executive system coupled to the server controlling the manufacturing machines. When the server determines that the wafers of the current lot do not comply with a predetermined specification, the manufacturing machines handling the wafers can be identified and the manufacturing executive system shuts down the identified manufacturing machines to calibrate parameters thereof. In addition, the wafers of the next lot are directly inspected to verify whether the identified manufacturing machines work well.
    Type: Application
    Filed: August 2, 2002
    Publication date: March 27, 2003
    Applicant: Powerchip Semiconductor Corp.
    Inventor: Pei-Chen Hsieh