Abstract: The present application proposes a memory chip includes a plurality of memory banks, a plurality of address pins, and a pseudo-address determining circuit. The plurality of address pins is arranged for receiving a plurality of address signals corresponding to the plurality of memory banks, respectively. The pseudo-address determining circuit has a plurality of input terminals coupled to the plurality of address pins, respectively, and a plurality of output terminals coupled to the plurality of memory banks. The pseudo-address determining circuit generates a pseudo-address table for the plurality of memory banks when the memory chip is powered-up. The pseudo-address table has a plurality of pseudo-addresses corresponding to the plurality of memory banks, respectively. The present application also provides a memory module that incorporates the memory chip and a method for pseudo-accessing memory banks of the memory chip.

Abstract: The present application proposes a memory chip includes a plurality of memory banks, a plurality of address pins, and a pseudo-address determining circuit. The plurality of address pins is arranged for receiving a plurality of address signals corresponding to the plurality of memory banks, respectively. The pseudo-address determining circuit has a plurality of input terminals coupled to the plurality of address pins, respectively, and a plurality of output terminals coupled to the plurality of memory banks. The pseudo-address determining circuit generates a pseudo-address table for the plurality of memory banks when the memory chip is powered-up. The pseudo-address table has a plurality of pseudo-addresses corresponding to the plurality of memory banks, respectively. The present application also provides a memory module that incorporates the memory chip and a method for pseudo-accessing memory banks of the memory chip.

Abstract: A fuse circuit comprises a fuse set and an enable circuit. The enable circuit is configured to receive a test mode enable signal and a power up signal to generate an enable signal and a voltage level to the fuse set for indicating whether an external supply voltage reaches a predetermined value and whether a test mode is enabled. In particular, an output signal of the fuse set is constant in the test mode, regardless of whether a fuse in the fuse set is blown or not.

Abstract: A fuse circuit comprises a fuse set and an enable circuit. The enable circuit is configured to receive a test mode enable signal and a power up signal to generate an enable signal and a voltage level to the fuse set for indicating whether an external supply voltage reaches a predetermined value and whether a test mode is enabled. In particular, an output signal of the fuse set is constant in the test mode, regardless of whether a fuse in the fuse set is blown or not.

Abstract: A fuse-fetching circuit comprises a plurality of fuses, a plurality of first switches and a shift register. Each of the first switches includes a first data end, a second data end and a control end. The first data end is connected to the fuse, and the control end is controlled by a fuse-fetching signal. The shift register includes a plurality of registers, each of which includes a first latch, a first transmission gate, a second latch and a second transmission gate. The first latch is connected to the second data end of the first switch.

Abstract: A fuse-fetching circuit comprises a plurality of fuses, a plurality of first switches and a shift register. Each of the first switches includes a first data end, a second data end and a control end. The first data end is connected to the fuse, and the control end is controlled by a fuse-fetching signal. The shift register includes a plurality of registers, each of which includes a first latch, a first transmission gate, a second latch and a second transmission gate. The first latch is connected to the second data end of the first switch.

Abstract: A data refresh method of a pseudo static random access memory is implemented by the following procedure. First, an address string and a refresh signal are provided, in which the address string is used for the reference of data reading and writing positions. Secondly, within at least one address of the address string, the active time of a word line of the PSRAM is set to be equivalent to or less than a half of the period of the refresh signal. Then, refreshing performs while the word line is off, and reading and writing are performed while the word line is active. If writing is requested while the word line is off, the writing will be performed when an address transition detection signal ATD switches to the high level in the next address.

Abstract: A circuit with variable voltage boosting ratios in a memory device for raising a booster line includes the first and second capacitors, and first and second switching means. The first capacitor electrically connects to the booster line for raising the voltage level on the booster line. The second capacitor couples to the booster line through the first switching means and the power line through the second switching means, respectively. When the first switching means is turned on and the second switching means is turned off, the second capacitor boosts the booster line together with the first capacitor. When the first switching means is turned off and the second switching means is turned on, the second switching means is precharged by the power line instead of boosting the booster line.