Patents by Inventor Pei-Lung Yeh

Pei-Lung Yeh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for cloud testing and remote monitoring of integrated circuit devices
    Patent number: 9140745
    Abstract: In a system and method for cloud testing and remote monitoring of IC devices on a computerized test platform, the computerized test platform sends to a cloud server unit, which stores test programs corresponding respectively to different test items, a test request, which includes respective device codes of the IC devices and one (s) of the test items, via a communication network. The cloud server unit sends to the computerized test platform a test response, which includes one (s) of the test programs corresponding to the one (s) of the test items. The computerized test platform products test data corresponding to the device codes of the IC devices in response to execution of the one (s) of the test programs.
    Type: Grant
    Filed: March 5, 2014
    Date of Patent: September 22, 2015
    Assignee: Unigen Corporation
    Inventors: David S. Lin, Yu-Chieh Tseng, Pei-Lung Yeh, Yi-Chieh Lin, Che-Chen Chuang
  • SYSTEM AND METHOD FOR CLOUD TESTING AND REMOTE MONITORING OF INTEGRATED CIRCUIT DEVICES
    Publication number: 20150253379
    Abstract: In a system and method for cloud testing and remote monitoring of IC devices on a computerized test platform, the computerized test platform sends to a cloud server unit, which stores test programs corresponding respectively to different test items, a test request, which includes respective device codes of the IC devices and one(s) of the test items, via a communication network. The cloud server unit sends to the computerized test platform a test response, which includes one(s) of the test programs corresponding to the one(s) of the test items. The computerized test platform products test data corresponding to the device codes of the IC devices in response to execution of the one(s) of the test programs.
    Type: Application
    Filed: March 5, 2014
    Publication date: September 10, 2015
    Applicant: UNIGEN CORPORATION
    Inventors: David S. Lin, Yu-Chieh Tseng, Pei-Lung Yeh, Yi-Chieh Lin, Che-Chen Chuang