Patents by Inventor Pei-Ying Li

Pei-Ying Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Metal gate structure and fabrication method thereof
    Patent number: 9281374
    Abstract: A metal gate structure located on a substrate includes a gate dielectric layer, a metal layer and a titanium aluminum nitride metal layer. The gate dielectric layer is located on the substrate. The metal layer is located on the gate dielectric layer. The titanium aluminum nitride metal layer is located on the metal layer.
    Type: Grant
    Filed: September 19, 2014
    Date of Patent: March 8, 2016
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Tsun-Min Cheng, Min-Chuan Tsai, Chih-Chien Liu, Jen-Chieh Lin, Pei-Ying Li, Shao-Wei Wang, Mon-Sen Lin, Ching-Ling Lin
  • METAL GATE STRUCTURE AND FABRICATION METHOD THEREOF
    Publication number: 20150004780
    Abstract: A metal gate structure located on a substrate includes a gate dielectric layer, a metal layer and a titanium aluminum nitride metal layer. The gate dielectric layer is located on the substrate. The metal layer is located on the gate dielectric layer. The titanium aluminum nitride metal layer is located on the metal layer.
    Type: Application
    Filed: September 19, 2014
    Publication date: January 1, 2015
    Inventors: Tsun-Min Cheng, Min-Chuan Tsai, Chih-Chien Liu, Jen-Chieh Lin, Pei-Ying Li, Shao-Wei Wang, Mon-Sen Lin, Ching-Ling Lin
  • Metal gate structure and fabrication method thereof
    Patent number: 8872286
    Abstract: A metal gate structure located on a substrate includes a gate dielectric layer, a metal layer and a titanium aluminum nitride metal layer. The gate dielectric layer is located on the substrate. The metal layer is located on the gate dielectric layer. The titanium aluminum nitride metal layer is located on the metal layer.
    Type: Grant
    Filed: August 22, 2011
    Date of Patent: October 28, 2014
    Assignee: United Microelectronics Corp.
    Inventors: Tsun-Min Cheng, Min-Chuan Tsai, Chih-Chien Liu, Jen-Chieh Lin, Pei-Ying Li, Shao-Wei Wang, Mon-Sen Lin, Ching-Ling Lin
  • METAL GATE STRUCTURE AND FABRICATION METHOD THEREOF
    Publication number: 20130049141
    Abstract: A metal gate structure located on a substrate includes a gate dielectric layer, a metal layer and a titanium aluminum nitride metal layer. The gate dielectric layer is located on the substrate. The metal layer is located on the gate dielectric layer. The titanium aluminum nitride metal layer is located on the metal layer.
    Type: Application
    Filed: August 22, 2011
    Publication date: February 28, 2013
    Inventors: Tsun-Min Cheng, Min-Chuan Tsai, Chih-Chien Liu, Jen-Chieh Lin, Pei-Ying Li, Shao-Wei Wang, Mon-Sen Lin, Ching-Ling Lin