Abstract: A system for optimizing the number of dies that can be fabricated on a wafer uses a die number optimization (DNO) routine to determine a maximum number of dies for a target die area (TDA), and generate an initial result list of die shapes that have the maximum number of dies for the TDA. Optionally, a die size optimization (DSO) routine can be executed to determine a list of die shapes having a maximum die area corresponding to the maximum number of dies, a first list of optimized die shapes having a maximum area utilization (AU) for a decreased TDA, and/or a second list of optimized die shapes having a minimum AU for an increased TDA. A candidate list (CL) of the various die shapes can be generated, and entries from the CL automatically selected and/or displayed to indicate proposed wafer layouts.

Abstract: A system for optimizing the number of dies that can be fabricated on a wafer uses a die number optimization (DNO) routine to determine a maximum number of dies for a target die area (TDA), and generate an initial result list of die shapes that have the maximum number of dies for the TDA. Optionally, a die size optimization (DSO) routine can be executed to determine a list of die shapes having a maximum die area corresponding to the maximum number of dies, a first list of optimized die shapes having a maximum area utilization (AU) for a decreased TDA, and/or a second list of optimized die shapes having a minimum AU for an increased TDA. A candidate list (CL) of the various die shapes can be generated, and entries from the CL automatically selected and/or displayed to indicate proposed wafer layouts.

Abstract: A Raman spectrometer including a laser excitation source, edge filters, and detection optics that direct light into a spectrograph. A spectrograph containing a dispersive element and optics that directs various wavelengths of light onto a segmented diffractive MEMS light modulator array. The MEMS array, depending on actuation state, directs light either to or away from a single detector. Control electronics drive the MEMS light modulator for either sequential wavelength measurement or multiplexed wavelength measurement (Hadamard for example).

Abstract: Systems and methods disclosed include: a support apparatus configured to detachably receive a chip; movable pins extendible from a first position to a second position, where, in the first position, the movable pins do not contact a chip positioned on the support apparatus, and in the second position, the movable pins contact electrical terminals of a heating element within a chip positioned on the support apparatus; a radiation source configured to direct radiation to be incident on a chip positioned on the support apparatus; a detector; and an electronic processor, the electronic processor being configured to detect molecules in a sample positioned within the chip, and to determine a temperature of the chip by measuring an electrical resistance between two of the multiple pins connected to the electrical terminals.

Abstract: A method of identifying the presence of heroin in an impure heroin composition which contains heroin and at least one fluorescent contaminant which interferes with a Raman signal from the heroin. The method may include contacting the mixture with a solvent such as an alcohol, then contacting the resulting alcohol composition with a SERS surface. The surface may then be exposed to laser light from a hand-held Raman spectrometer to detect a Raman signal from the heroin. An apparatus for performing the method is also provided.

Abstract: We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.

Abstract: We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.

Abstract: The apparatus disclosed herein features: (a) a handheld, portable spectrometer that includes a radiation source configured to direct incident radiation to a sample, a detector configured to receive signal radiation from the sample, and a housing enclosing the radiation source and the detector; (b) an extended member attachable to the housing and having an interior channel to define a path for directing radiation from the source to the sample and for receiving radiation from the sample at the detector; (c) and a vial receptacle configured to hold a different sample and positioned to receive radiation from the source, where the detector is positioned to receive radiation from the different sample and the housing is configured to support the vial receptacle and attach to the extended member at the same time.

Abstract: We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.

Abstract: We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.

Abstract: We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.

Abstract: Systems and methods disclosed include: a support apparatus configured to detachably receive a chip; movable pins extendible from a first position to a second position, where, in the first position, the movable pins do not contact a chip positioned on the support apparatus, and in the second position, the movable pins contact electrical terminals of a heating element within a chip positioned on the support apparatus; a radiation source configured to direct radiation to be incident on a chip positioned on the support apparatus; a detector; and an electronic processor, the electronic processor being configured to detect molecules in a sample positioned within the chip, and to determine a temperature of the chip by measuring an electrical resistance between two of the multiple pins connected to the electrical terminals.

Abstract: An apparatus includes: a handheld Raman analyzer that can include: a common platform; a laser assembly mounted on a laser platform, the laser platform supported on the common platform by a first material and a second thermally conductive material wherein the first material is softer than the second material; an optical probe head assembly disposed on the common platform, the optical probe head assembly spaced apart from the laser assembly; a spectrometer assembly disposed on the common platform, the spectrometer assembly spaced apart from the optical probe head assembly; and an analysis apparatus configured to identify a specimen based on a Raman signature received from the spectrometer. The laser assembly can be optically coupled to the optical probe head assembly by at least a first free-space coupling region and the optical probe head assembly optically coupled to the spectrometer assembly by at least a second free-space coupling region.

Abstract: A laser package comprising a semiconductor laser having an operating temperature range and a heater, wherein the heater is configured to heat the laser when the laser package is positioned in an environment having an ambient temperature which lies outside of the operating temperature range of the laser, so that the laser will remain within the operating temperature range.

Abstract: We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.

Abstract: We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.

Abstract: Disclosed herein are Raman probes that include: (a) a first optical fiber for receiving laser excitation light from a light source and transmitting the same; (b) a first filter for receiving light from the first optical fiber and adapted to pass the laser excitation light and to block spurious signals associated with the light; (c) a second filter for receiving light from the first filter and adapted to direct the light toward a specimen; and (d) focusing apparatus for receiving the light from the second filter, focusing the light on the specimen so as to generate the Raman signal, and returning the Raman signal to the second filter. The second filter is further configured so that when the second filter receives the Raman signal from the focusing apparatus, the second filter filters out unwanted laser excitation light before directing the Raman signal to a second optical fiber.

Abstract: Disclosed herein are Raman probes that include: (a) a first optical fiber for receiving laser excitation light from a light source and transmitting the same; (b) a first filter for receiving light from the first optical fiber and adapted to pass the laser excitation light and to block spurious signals associated with the light; (c) a second filter for receiving light from the first filter and adapted to direct the light toward a specimen; and (d) focusing apparatus for receiving the light from the second filter, focusing the light on the specimen so as to generate the Raman signal, and returning the Raman signal to the second filter. The second filter is further configured so that when the second filter receives the Raman signal from the focusing apparatus, the second filter filters out unwanted laser excitation light before directing the Raman signal to a second optical fiber.

Abstract: A Raman probe system includes: a base station; a mobile robot remotely controllable from the base station; a Raman probe assembly supported by the robot, the Raman probe assembly including a laser and a spectrometer; a camera supported by the robot; and a communication subsystem operable to communicate images from the camera and results from the Raman probe assembly to the base station. In some embodiments, a Raman probe system includes: a mobile robot remotely controllable from a base station, the robot including a body and an articulated arm; a camera supported by the robot; a Raman probe assembly supported by the robot, the optical control assembly mounted on the body of the robot; and an optical probe mounted on the articulated arm of the robot; and a wireless communication system operable to communicate images from the camera and results from the Raman probe assembly to the base station.

Abstract: A spectrometer comprising a collimating element for receiving input light and collimating the same, a dispersive optical element for receiving light from the collimating element and dispersing the same and a focusing element for receiving light from the dispersive optical element and focusing the same on a detector assembly wherein, where the wavelength dispersion of the dispersed light extends in the x-y direction, the collimating element and the focusing element are formed so as to maintain the desired optical parameters in the x-y plane while having a reduced size in the z direction.