Abstract: The disclosure discloses a mimetic database-based network operating system design method, including: designing a mimetic data structure; designing a mimetic data object; designing a synchronization mechanism and a decision mechanism, designing a mimetic database safe storage command processing system, and designing a classification storage mechanism for interacting data between service modules and a master database in a network operating system. By means of vertical hierarchy and horizontal classification, the problem of compatibility of the database subjected to mimetic transformation and a network operating system is solved. By means of a memory random distribution storage mechanism and a memory hardware heterogeneous storage mechanism, the cost caused by mimetic transformation can be reduced, and the cost is controllable while the safety is improved.

Abstract: The present disclosure discloses a design method for lightweight wired Mesh networking. The design method includes: designing a protocol format of a lightweight wired Mesh network message; designing an input parsing module of the lightweight wired Mesh network message; designing a heartbeat logic module between devices of the lightweight wired Mesh networking; designing a route management module of a lightweight wired Mesh network; designing a forwarding and processing module of the lightweight wired Mesh network message; and designing an underlying hardware interface management module.

Abstract: An improved charged particle beam inspection apparatus, and more particularly, a particle beam apparatus for inspecting a wafer including an improved scanning mechanism for detecting fast-charging defects is disclosed. An improved charged particle beam inspection apparatus may include a charged particle beam source that delivers charged particles to an area of the wafer and scans the area. The improved charged particle beam apparatus may further include a controller including a circuitry to produce multiple images of the area over a time sequence, which are compared to detect fast-charging defects.

Abstract: An improved charged particle beam inspection apparatus, and more particularly, a particle beam apparatus for inspecting a wafer including an improved scanning mechanism for detecting fast-charging defects is disclosed. An improved charged particle beam inspection apparatus may include a charged particle beam source that delivers charged particles to an area of the wafer and scans the area. The improved charged particle beam apparatus may further include a controller including a circuitry to produce multiple images of the area over a time sequence, which are compared to detect fast-charging defects.