Patents by Inventor PEIYONG ZHANG

PEIYONG ZHANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Programmable addressable test chip
    Patent number: 9646900
    Abstract: A programmable test chip includes a target chip to be tested and addressing circuits fabricated on the same wafer. The addressing circuits can be placed in the scribe lines or a pre-allocated area of the wafer. When testing the target chip, a circuit connecting the target chip and the addressing circuits can be fabricated on demand. In some cases the target chip is not connected to the addressing circuits, and a DUT array exists in a scribe line having a connecting circuit prefabricated between the addressing circuits with the DUT array for testing the DUT array in the scribe line. When the need for testing the target chip arises, the prefabricated connecting circuit can be cut, and the connecting circuit connecting the target chip and the addressing circuits can be fabricated. Based on results from such test chips, the manufacturing process can be better studied.
    Type: Grant
    Filed: January 24, 2015
    Date of Patent: May 9, 2017
    Assignee: Semitronix Corporation
    Inventors: Xu Ouyang, Yongjun Zheng, Zheng Shi, Peiyong Zhang
  • PROGRAMMABLE ADDRESSABLE TEST CHIP
    Publication number: 20150212144
    Abstract: A programmable test chip includes a target chip to be tested and addressing circuits fabricated on the same wafer. The addressing circuits can be placed in the scribe lines or a pre-allocated area of the wafer. When testing the target chip, a circuit connecting the target chip and the addressing circuits can be fabricated on demand. In some cases the target chip is not connected to the addressing circuits, and a DUT array exists in a scribe line having a connecting circuit prefabricated between the addressing circuits with the DUT array for testing the DUT array in the scribe line. When the need for testing the target chip arises, the prefabricated connecting circuit can be cut, and the connecting circuit connecting the target chip and the addressing circuits can be fabricated. Based on results from such test chips, the manufacturing process can be better studied.
    Type: Application
    Filed: January 24, 2015
    Publication date: July 30, 2015
    Inventors: XU OUYANG, YONGJUN ZHENG, ZHENG SHI, PEIYONG ZHANG
  • Circulating air pump
    Patent number: D986288
    Type: Grant
    Filed: April 26, 2021
    Date of Patent: May 16, 2023
    Assignee: Chengdu Cryo-Push Medical Technology Co., Ltd.
    Inventor: Peiyong Zhang