Abstract: A method is for manufacturing a radiation window for an X-ray measurement apparatus. The method includes producing an etch stop layer on a surface of a carrier and producing a foil structure on a side of the etch stop layer opposite the carrier. A combined structure with the etch stop layer and the foil structure is attached to a region around an opening in a housing of the X-ray measurement apparatus with the foil structure facing the housing so that an edge strengthening structure is arranged between the combined structure and an edge region around the opening in the housing or partly inside the foil structure. At least part of the carrier is detached before attaching the combined structure or detaching at least part of the carrier after attaching the combined structure, wherein the combined structure includes the carrier. A radiation window is for an X-ray measurement apparatus.

Abstract: A shield device (100) is for covering a radiation window (502). The shield device (100) includes a support structure (102) with an opening (106), and a flexible foil (104) covering at least the opening (106) of the support structure (102). The foil (104) includes carbon nanotubes in a form of a network (202) and the foil (104) is configured to allow radiation to pass through the foil (104) at least partly and to prevent objects (302) to pass through the foil (104). A radiation arrangement (500) includes a shield device (100), and a method is for producing a shield device (100) for a radiation window (502).

Abstract: For manufacturing a radiation window for an X-ray measurement apparatus, an etch stop layer is first produced on a polished surface of a carrier. A thin film deposition technique is used to produce a boron carbide layer on an opposite side of the etch stop layer than the carrier. The combined structure including the carrier, the etch stop layer, and the boron carbide layer is attached to a region around an opening in a support structure with the boron carbide layer facing the support structure. The middle area of carrier is etched away, leaving an additional support structure.

Abstract: For manufacturing a radiation window for an X-ray measurement apparatus, an etch stop layer is first produced on a polished surface of a carrier. A thin film deposition technique is used to produce a boron carbide layer on an opposite side of the etch stop layer than the carrier. The combined structure including the carrier, the etch stop layer, and the boron carbide layer is attached to a region around an opening in a support structure with the boron carbide layer facing the support structure. The middle area of carrier is etched away, leaving an additional support structure.

Abstract: A radiation window foil is provided for an X-ray radiation window. It includes a continuous window layer with a first side and a second side. A first mesh or grid layer is stacked on or bonded to the first side of the continuous window layer. A second mesh or grid layer is stacked on or bonded to the second side of the continuous window layer.

Abstract: A radiation window foil is provided for an X-ray radiation window. It includes a continuous window layer with a first side and a second side. A first mesh or grid layer is stacked on or bonded to the first side of the continuous window layer. A second mesh or grid layer is stacked on or bonded to the second side of the continuous window layer.