Patents by Inventor Pengxian Song

Pengxian Song has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DEFECT DETECTION METHOD AND APPARATUS FOR CUSHION LAYER OF CABLE, DEVICE, AND STORAGE MEDIUM
    Publication number: 20240241168
    Abstract: The present disclosure provides a defect detection method and apparatus for a cushion layer of a cable, a device, and a storage medium. The method includes: obtaining specification parameters of a corrugated sheath of a to-be-detected cable, calculating a first volume of a cushion layer without deformation and a second volume of a deformed portion of the cushion layer when the cushion layer is deformed under stress, and calculating a stressed-state deformation ratio of the cushion layer based on the first volume and the second volume; obtaining a voltage, a current, an electrode area, an electrode distance, and an initial electrode distance of the cushion layer when the stressed-state deformation ratio is reached, and calculating volume resistivity of the cushion layer; and comparing the volume resistivity with a preset evaluation parameter to obtain a defect detection result of the cushion layer.
    Type: Application
    Filed: August 9, 2022
    Publication date: July 18, 2024
    Inventors: Shengchen Fang, Yang Yu, Weibo Li, Pengxian Song, Chun He, Chi Zhang, Qinghua Tang, Longji Li, Chunhui Zhang, Songyuan Li, Fei Lu, Lin Li, Lei Yang, Xiaoguang Wang, Xuliang Zhu, Minghui Duan, Haoming Wang, Wei Fan
  • Defect detection method, apparatus, and device for semi-conducting bedding layer of power cable
    Patent number: 12019044
    Abstract: Defect detection method for a semi-conducting bedding layer of a power cable includes: obtaining a length parameter, a corrugation pitch parameter, radius parameters, and a thickness parameter of a power cable; obtaining a first resistance value between a shield and a corrugated sheath, and calculating a second resistance value of the shield based on the length parameter and the corrugation pitch parameter; calculating a radial resistance value of the semi-conducting bedding layer based on the first resistance value and the second resistance value; determining a contact angle of a critical point of contact between the corrugated sheath and the semi-conducting bedding layer based on the radius parameters and the thickness parameter; calculating volume resistivity of the semi-conducting bedding layer based on the radial resistance value and the contact angle; and comparing the volume resistivity with a preset evaluation parameter to obtain a defect detection result of the semi-conducting bedding layer.
    Type: Grant
    Filed: January 21, 2022
    Date of Patent: June 25, 2024
    Assignees: Electric Power Science & Research Institute of State Grid Tianjin Electric Power Company, State Grid Tianjin Electric Power Company
    Inventors: Shengchen Fang, Pengxian Song, Xu Li, Yang Yu, Mingzheng Zhu, Zhengzheng Meng, Fengzheng Zhou, Xiaohui Zhu, Lei Yang, Jun Zhang, Chun He, Nan Wang, Ke Xu, Qinghua Tang, Chi Zhang, Haoming Wang, Longji Li, Cheng Sun, Wei Fan
  • DEFECT DETECTION METHOD, APPARATUS, AND DEVICE FOR SEMI-CONDUCTING BEDDING LAYER OF POWER CABLE
    Publication number: 20240175839
    Abstract: Defect detection method for a semi-conducting bedding layer of a power cable includes: obtaining a length parameter, a corrugation pitch parameter, radius parameters, and a thickness parameter of a power cable; obtaining a first resistance value between a shield and a corrugated sheath, and calculating a second resistance value of the shield based on the length parameter and the corrugation pitch parameter; calculating a radial resistance value of the semi-conducting bedding layer based on the first resistance value and the second resistance value; determining a contact angle of a critical point of contact between the corrugated sheath and the semi-conducting bedding layer based on the radius parameters and the thickness parameter; calculating volume resistivity of the semi-conducting bedding layer based on the radial resistance value and the contact angle; and comparing the volume resistivity with a preset evaluation parameter to obtain a defect detection result of the semi-conducting bedding layer.
    Type: Application
    Filed: January 21, 2022
    Publication date: May 30, 2024
    Inventors: Shengchen Fang, Pengxian Song, Xu Li, Yang Yu, Mingzheng Zhu, Zhengzheng Meng, Fengzheng Zhou, Xiaohui Zhu, Lei Yang, Jun Zhang, Chun He, Nan Wang, Ke Xu, Qinghua Tang, Chi Zhang, Haoming Wang, Longji Li, Cheng Sun, Wei Fan