Patents by Inventor Petar Ivanov Krotnev

Petar Ivanov Krotnev has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10693589
    Abstract: Devices and methods are provided for performing a high-frequency jitter self stress check on a receiver to assist with optimization. High-frequency jitter is injected into a clock signal recovered from a received data signal and used to sample the data signal. The injected jitter increases the bit error rate (BER), making BER a more useful and quicker optimization metric in applications using low-noise communication links. Error correction is used to maintain acceptable output BER while the self stress check is in progress.
    Type: Grant
    Filed: June 18, 2018
    Date of Patent: June 23, 2020
    Assignee: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Ehud Nir, Henry Wong, Petar Ivanov Krotnev
  • Patent number: 10523341
    Abstract: A method includes deactivating transmitters of a first plurality of transceivers that are associated with an endpoint to multi-channel communication fabric. A given transceiver of the first plurality of transceivers includes a receiver. The method includes controlling the given transceiver to cause the given transceiver to couple a reference source of the given transceiver to a first node of the receiver, measure a first value at a second node of the receiver, and determine a gain between the first node and the second node based on the measured first value. The method includes controlling the given receiver to cause the given receiver to isolate the reference source from the first node of the receiver; and measuring, by the given transceiver, a second value at the second node and determining, by the given transceiver, an intrinsic noise based on the measured second value.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: December 31, 2019
    Assignee: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Petar Ivanov Krotnev, Davide Tonietto, Marc-Andre LaCroix
  • Publication number: 20190386773
    Abstract: Devices and methods are provided for performing a high-frequency jitter self stress check on a receiver to assist with optimization. High-frequency jitter is injected into a clock signal recovered from a received data signal and used to sample the data signal. The injected jitter increases the bit error rate (BER), making BER a more useful and quicker optimization metric in applications using low-noise communication links. Error correction is used to maintain acceptable output BER while the self stress check is in progress.
    Type: Application
    Filed: June 18, 2018
    Publication date: December 19, 2019
    Inventors: Ehud Nir, Henry Wong, Petar Ivanov Krotnev