Abstract: Embodiments of the present invention provide a fast correlation (FASTCO) extension module that can couple various components for device testing and quickly correlate measurements of bench equipment with measurements of ATEs for more accurate and efficient device testing. Moreover, the FASTCO modules disclosed herein allow the same test fixtures and load board to be used by both the ATE and bench equipment, which significantly simplifies the correlation process. Moreover, a high-level programming language can be used to generate commands and data to control the FASTCO modules for routing signals to various components, such as the automated test equipment (ATE), any bench equipment (e.g., a signal generator, spectrum analyzer, etc.), DUTs, etc., and the routing can be managed automatically by the ATE according to a test program, for example.

Abstract: A Built-in-Self-Test (BIST) centric Automatic Test Equipment (ATE) framework can include a host controller and one or more tester units. The host controller can be configured to receive one or more inputs to initiate testing of a plurality of Devices Under Test (DUTs). The one or more tester unit can include a plurality of Universal Asynchronous Receiver-Transmitters (UARTs) communication links. The UART communication links can be configured to send one or more commands for initiating and controlling a Built-in-Self-Test (BIST) in the plurality of DUTs. The UART communication links can also be configured to receive test output data of the BIST from the plurality of DUTs. The host controller can also be configured to output the test output data of the BIST.

Abstract: A Built-in-Self-Test (BIST) centric Automatic Test Equipment (ATE) framework can include a host controller and one or more tester units. The host controller can be configured to receive one or more inputs to initiate testing of a plurality of Devices Under Test (DUTs). The one or more tester unit can include a plurality of Universal Asynchronous Receiver-Transmitters (UARTs) communication links. The UART communication links can be configured to send one or more commands for initiating and controlling a Built-in-Self-Test (BIST) in the plurality of DUTs. The UART communication links can also be configured to receive test output data of the BIST from the plurality of DUTs. The host controller can also be configured to output the test output data of the BIST.