Abstract: A method of manufacturing a water-soluble transfer stack comprising multilayer two-dimensional material includes: i. Providing a growth stack comprising a growth substrate and a two-dimensional material layer; ii. Applying an intercalating solution, to the growth stack; iii. Applying a transfer layer comprising a water-soluble polymer film, to the growth stack; iv. Delaminating the water-soluble polymer film together with the two-dimensional material layer, thereby obtaining a delaminated film, from the growth substrate; and v. Repeating steps i.-iv. a number of times, wherein the delaminated film is used as the transfer layer; thereby manufacturing a water-soluble transfer stack comprising multilayer two-dimensional material.

Abstract: The present application discloses a method for separating a graphene-support layer laminate from a conducting substrate-graphene-support layer laminate, using a gentle, controllable electrochemical method. In this way, substrates which are fragile, expensive or difficult to manufacture can be used—and even re-used—without damage or destruction of the substrate or the graphene.

Abstract: One or more digital representations of single- (101) and/or few-layer (102) thin-film material are automatically identified robustly and reliably in a digital image (100), the digital image (100) having a predetermined number of color components, by—determining (304) a background color component of the digital image (100) for each color component, and—determining or estimating (306) a color component of thin-film material to be identified in the digital image (100) for each color component by obtaining a pre-determined contrast value (CR; CG; CB) for each color component and multiplying the respective background color component with a numerical difference between the pre-determined contrast value (CR; CG; CB) for a given color component and about 1,—identifying points or parts of the image with all color components being within a predetermined range of the determined or estimated color component.

Abstract: One or more digital representations of single- (101) and/or few-layer (102) thin-film material are automatically identified robustly and reliably in a digital image (100), the digital image (100) having a predetermined number of colour components, by—determining (304) a background colour component of the digital image (100) for each colour component, and—determining or estimating (306) a colour component of thin-film material to be identified in the digital image (100) for each colour component by obtaining a pre-determined contrast value (CR; CG; CB) for each colour component and multiplying the respective background colour component with a numerical difference between the pre-determined contrast value (CR; CG; CB) for a given colour component and about 1, —identifying points or parts of the image with all colour components being within a predetermined range of the determined or estimated colour component.

Abstract: A multi-point electrical probe for testing location-specific electrical properties on circuit boards. Four generally parallel, electrically conducting probe arms are produced preferably by wafer-based techniques, although any even number of probe arms between two and 64 may be used. The precision of wafer-based manufacturing techniques permits miniaturization beyond that which is conventionally obtained by assembling discrete components. The probe arms are generally flexible, and may be shaped suitably to accommodate a particular circuit geometry. The probe and/or the sample under test may be precisely located by suitable translation and/or rotation stages, which may optionally be placed under computer control. A suitable wiring diagram is provided, and preferable manufacturing techniques are discussed.

Abstract: The multi-point probe comprises a supporting body defining a first surface, a first multitude of conductive probe arms each of the probe arms defining a proximal end and a distal end being positioned in co-planar relationship with the first surface of the supporting body. The probe arms are connected to the supporting body at the proximal ends thereof and have the distal ends freely extending from the supporting body, giving individually flexible motion to the first multitude of probe arms. The probe arms originate from a process of producing the probe arms on a wafer body in facial contact with the wafer body and removal of a part of the wafer body providing the supporting body and providing the probe arms freely extending therefrom. The multi-point probe further comprises a third multitude of tip elements extending from the distal end of the first multitude of probe arms. The tip elements originate from a process of metallization of electron beam depositions on the probe arms at the distal ends thereof.

Abstract: An object of the present invention is to provide a novel testing probe allowing the testing of electronic circuits of a smaller dimension as compared to the prior art testing technique.

Abstract: A multi-point probe, a method for producing the multi-point probe and a cylindrical nano-drive for in particular driving the multi-point probe in a multi-point testing apparatus for testing electric properties on a specific location of a test sample. The multi-point probe comprises a supporting body defining a first surface, a first multitude of conductive probe arms each of the conductive probe arms defining a proximal end and a distal end being positioned in co-planar relationship with the first surface of the supporting body. The conductive probe arms are connected to the supporting body at the proximal ends thereof and have the distal ends freely extending from the supporting body, giving individually flexible motion to the first multitude of conductive probe arms.

Abstract: The present invention relates to fabrication and application of nano-manipulators with induced growth using a focused particle beam. Induced growth may be used to fabricate nano-manipulators, such as a nano-tweezers or grippers, which allows for a very precise and flexible design. Also, applying the growth techniques together with nano-manipulators provides a strong tool for performing complex operations performing pick & place operations with nanoscale structures and fabrication of other nano-manipulators.

Abstract: An object of the present invention is to provide a novel testing probe allowing the testing of electronic circuits of a smaller dimension as compared to the prior art testing technique. A particular advantage of the present invention is related to the fact that the novel testing technique involving a novel multi-point probe allows the prove to be utilized for establishing a reliable contact between any testing pin or testing tip and a specific location of a test sample, as the testing probe according to the present invention includes individually bendable or flexible testing pins.