Patents by Inventor Peter C. Serubo

Peter C. Serubo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Self-service circuit testing systems and methods
    Patent number: 8737574
    Abstract: In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user portal including a tool enabling the user to select a signal loop for testing at least a section of the circuit, the signal loop being selected from a plurality of signal loop options. The system also includes a network management subsystem communicatively coupled to the test management subsystem, the network management subsystem being configured to receive data representative of the selection from the test management subsystem and instruct, based on the selection, a network device along the circuit to execute a loop-back mode. In certain embodiments, the selected signal loop defines a test pattern signal flow for testing a subsection of the circuit.
    Type: Grant
    Filed: December 21, 2011
    Date of Patent: May 27, 2014
    Assignee: Verizon Patent and Licensing Inc.
    Inventors: Yiming Wang, Lauren B. Adelson, David J. Buie, Colleen Davis, Peter C. Serubo, Roland J. Zito-Wolf
  • SELF-SERVICE CIRCUIT TESTING SYSTEMS AND METHODS
    Publication number: 20120123727
    Abstract: In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user portal including a tool enabling the user to select a signal loop for testing at least a section of the circuit, the signal loop being selected from a plurality of signal loop options. The system also includes a network management subsystem communicatively coupled to the test management subsystem, the network management subsystem being configured to receive data representative of the selection from the test management subsystem and instruct, based on the selection, a network device along the circuit to execute a loop-back mode. In certain embodiments, the selected signal loop defines a test pattern signal flow for testing a subsection of the circuit.
    Type: Application
    Filed: December 21, 2011
    Publication date: May 17, 2012
    Applicants: Verizon Business Financial Managment Corporation, Verizon Data Services Inc., Verizon Services Corp.
    Inventors: Yiming Wang, Lauren B. Adelson, David J. Buie, Colleen Davis, Peter C. Serubo, Roland J. Zito-Wolf
  • Self-service circuit testing systems and methods
    Patent number: 8098797
    Abstract: In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user portal including a tool enabling the user to select a signal loop for testing at least a section of the circuit, the signal loop being selected from a plurality of signal loop options. The system also includes a network management subsystem communicatively coupled to the test management subsystem, the network management subsystem being configured to receive data representative of the selection from the test management subsystem and instruct, based on the selection, a network device along the circuit to execute a loop-back mode. In certain embodiments, the selected signal loop defines a test pattern signal flow for testing a subsection of the circuit.
    Type: Grant
    Filed: December 27, 2006
    Date of Patent: January 17, 2012
    Assignee: Verizon Patent and Licensing Inc.
    Inventors: Yiming Wang, Lauren B. Adelson, David J. Buie, Colleen Davis, Peter C. Serubo, Roland J. Zito-Wolf
  • SELF-SERVICE CIRCUIT TESTING SYSTEMS AND METHODS
    Publication number: 20080162678
    Abstract: In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user portal including a tool enabling the user to select a signal loop for testing at least a section of the circuit, the signal loop being selected from a plurality of signal loop options. The system also includes a network management subsystem communicatively coupled to the test management subsystem, the network management subsystem being configured to receive data representative of the selection from the test management subsystem and instruct, based on the selection, a network device along the circuit to execute a loop-back mode. In certain embodiments, the selected signal loop defines a test pattern signal flow for testing a subsection of the circuit.
    Type: Application
    Filed: December 27, 2006
    Publication date: July 3, 2008
    Applicants: Verizon Business Financial Management Corporation, Verizon Services Corp., Verizon Data Services Inc.
    Inventors: Yiming Wang, Lauren B. Adelson, David J. Buie, Colleen Davis, Peter C. Serubo, Roland J. Zito-Wolf