Patents by Inventor Peter Champ

Peter Champ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10323927
    Abstract: A method for calibrating a triangulation sensor including a light emitting unit for emitting measuring light and a light receiving unit. The light emitting unit is arranged with known position and orientation relative to the light receiving unit and the triangulation sensor which is adapted to provide triangulation-based position measurements. A calibration setup which comprises the triangulation sensor and a calibration target providing a defined calibration pattern, and a calibration measurement is performed with reference to the calibration target by means of the triangulation sensor. An image of the calibration target is captured by means of the light receiving unit, and the captured image is processed with deriving a pattern image position with reference to the inner sensor image coordinate system and deriving a light image position with reference to the inner sensor image coordinate system.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: June 18, 2019
    Assignee: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Johan Stigwall, Beat Aebischer, Peter Champ
  • Patent number: 10302745
    Abstract: Some embodiments of the invention include a method for determining distances to an object to be measured based on the principle of triangulation, comprising generating and emitting a measuring light beam, directing the measuring light beam to the object to be measured, detecting a reflection of the measuring light from the object with respective pixels of an image sensor during a defined detection sequence (t0-te) and deriving distance information based on the detected reflection. The detection sequence (t0-te) comprises a number of at least two exposure sub-sequences each defining a particular exposure period and saturation limit for the pixels of the sensor, wherein a successive exposure sub-sequence comprises a higher saturation limit than its prior exposure sub-sequence and each saturation limit defines a maximum charging level of the pixels for the respective exposure sub-sequence.
    Type: Grant
    Filed: November 3, 2016
    Date of Patent: May 28, 2019
    Assignee: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Johan Stigwall, Thomas Jensen, Peter Champ
  • Publication number: 20180372481
    Abstract: A method for calibrating a triangulation sensor including a light emitting unit for emitting measuring light and a light receiving unit. The light emitting unit is arranged with known position and orientation relative to the light receiving unit and the triangulation sensor which is adapted to provide triangulation-based position measurements. A calibration setup which comprises the triangulation sensor and a calibration target providing a defined calibration pattern, and a calibration measurement is performed with reference to the calibration target by means of the triangulation sensor. An image of the calibration target is captured by means of the light receiving unit, and the captured image is processed with deriving a pattern image position with reference to the inner sensor image coordinate system and deriving a light image position with reference to the inner sensor image coordinate system.
    Type: Application
    Filed: June 22, 2018
    Publication date: December 27, 2018
    Applicant: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Johan STIGWALL, Beat AEBISCHER, Peter CHAMP
  • Patent number: 10042054
    Abstract: A distance measuring method for a point on an object is performed by emitting measurement radiation. When an optical measurement axis of the measurement radiation is aligned with the point to be measured, an optical measurement point region is defined by the beam cross section of the radiation on the object. The beam cross section may be, for example, a maximum of eight times the standard deviation of a Gaussian steel profile of the measurement radiation. The the distance to the point on the object is determined by receiving measurement radiation reflected from the object. The method includes altering, at least once, a measurement direction as emission direction of the measurement radiation with respective emission and reception of the measurement radiation. Altering the measurement direction is carried out such that respective area centroids defined by the beam cross section on the object lie within the measurement point region.
    Type: Grant
    Filed: January 29, 2014
    Date of Patent: August 7, 2018
    Assignees: HEXAGON TECHNOLOGY CENTER GMBH, HEXAGON METROLOGY GMBH
    Inventors: Thomas Jensen, Knut Siercks, Peter Champ, Matthias Geil
  • Publication number: 20170123053
    Abstract: Some embodiments of the invention include a method for determining distances to an object to be measured based on the principle of triangulation, comprising generating and emitting a measuring light beam, directing the measuring light beam to the object to be measured, detecting a reflection of the measuring light from the object with respective pixels of an image sensor during a defined detection sequence (t0-te) and deriving distance information based on the detected reflection. The detection sequence (t0-te) comprises a number of at least two exposure sub-sequences each defining a particular exposure period and saturation limit for the pixels of the sensor, wherein a successive exposure sub-sequence comprises a higher saturation limit than its prior exposure sub-sequence and each saturation limit defines a maximum charging level of the pixels for the respective exposure sub-sequence.
    Type: Application
    Filed: November 3, 2016
    Publication date: May 4, 2017
    Applicant: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Johan STIGWALL, Thomas JENSEN, Peter CHAMP
  • Publication number: 20140211191
    Abstract: A distance measuring method for a point on an object is performed by emitting measurement radiation. When an optical measurement axis of the measurement radiation is aligned with the point to be measured, an optical measurement point region is defined by the beam cross section of the radiation on the object. The beam cross section may be, for example, a maximum of eight times the standard deviation of a Gaussian steel profile of the measurement radiation. The distance to the point on the object is determined by receiving measurement radiation reflected from the object. The method includes altering, at least once, a measurement direction as emission direction of the measurement radiation with respective emission and reception of the measurement radiation. Altering the measurement direction is carried out such that respective area centroids defined by the beam cross section on the object lie within the measurement point region.
    Type: Application
    Filed: January 29, 2014
    Publication date: July 31, 2014
    Inventors: Thomas JENSEN, Knut SIERCKS, Peter CHAMP, Matthias GEIL
  • Patent number: 8353059
    Abstract: The present invention relates to a scanning probe (2) for capturing data from a plurality of points on the surface of an object by irradiating the object with a light stripe and detecting light reflected from the object surface, the scanning probe comprising (a) stripe generating means (14) for generating and emitting a light stripe (55); (b) a camera (16) comprising an imaging sensor having an array of pixels to detect the light stripe reflected from the object surface; (c) means for adjusting the intensity of the light stripe (55) during acquisition of the frame, in dependence upon the intensities detected by the camera (16). It also relates to a means to modify the stripe length, a scanner with separate compartment for the processing means, and an attachable dust cover for a scanner.
    Type: Grant
    Filed: July 6, 2011
    Date of Patent: January 8, 2013
    Assignee: Metris N.V.
    Inventors: Stephen James Crampton, Peter Champ
  • Patent number: 8327555
    Abstract: A coordinate measurement device comprises an articulated arm and a laser scanner assembly. The articulated arm can have a first end, a second end, and a plurality of jointed arm segments therebetween. Each arm segment can define at least one axis of rotation, and a last axis of rotation can be defined by bearings near a distal end of the arm. The laser scanner assembly can couple to the distal end of the arm. The arm can continuously generate trigger signals that are received by the laser scanner and indicate a time at which the arm's position is measured.
    Type: Grant
    Filed: December 21, 2011
    Date of Patent: December 11, 2012
    Assignee: Hexagon Metrology AB
    Inventor: Peter Champ
  • Publication number: 20120090185
    Abstract: A coordinate measurement device comprises an articulated arm and a laser scanner assembly. The articulated arm can have a first end, a second end, and a plurality of jointed arm segments therebetween. Each arm segment can define at least one axis of rotation, and a last axis of rotation can be defined by bearings near a distal end of the arm. The laser scanner assembly can couple to the distal end of the arm. The arm can continuously generate trigger signals that are received by the laser scanner and indicate a time at which the arm's position is measured.
    Type: Application
    Filed: December 21, 2011
    Publication date: April 19, 2012
    Applicant: HEXAGON METROLOGY AB
    Inventor: Peter Champ
  • Patent number: 8117668
    Abstract: The present invention relates to a scanning probe (2) for capturing data from a plurality of points on the surface of an object by irradiating the object with a light stripe and detecting light reflected from the object surface, the scanning probe comprising (a) stripe generating means (14) for generating and emitting a light stripe (55); (b) a camera (16) comprising an imaging sensor having an array of pixels to detect the light stripe reflected from the object surface: (c) means for adjusting the intensity of the light stripe (55) during acquisition of the frame, in dependence upon the intensities detected by the camera (16). It also relates to a means to modify the stripe length, a scanner with separate compartment for the processing means, and an attachable dust cover for a scanner.
    Type: Grant
    Filed: April 26, 2007
    Date of Patent: February 14, 2012
    Inventors: Stephen James Crampton, Peter Champ
  • Publication number: 20120026510
    Abstract: The present invention relates to a scanning probe (2) for capturing data from a plurality of points on the surface of an object by irradiating the object with a light stripe and detecting light reflected from the object surface, the scanning probe comprising (a) stripe generating means (14) for generating and emitting a light stripe (55); (b) a camera (16) comprising an imaging sensor having an array of pixels to detect the light stripe reflected from the object surface; (c) means for adjusting the intensity of the light stripe (55) during acquisition of the frame, in dependence upon the intensities detected by the camera (16). It also relates to a means to modify the stripe length, a scanner with separate compartment for the processing means, and an attachable dust cover for a scanner.
    Type: Application
    Filed: July 6, 2011
    Publication date: February 2, 2012
    Applicant: Metris N.V.
    Inventors: Stephen James Crampton, Peter Champ
  • Patent number: 8099877
    Abstract: A coordinate measurement device comprises an articulated arm and a laser scanner assembly. The articulated arm can have a first end, a second end, and a plurality of jointed arm segments therebetween. Each arm segment can define at least one axis of rotation, and a last axis of rotation can be defined by bearings near a distal end of the arm. The laser scanner assembly can couple to the distal end of the arm. The arm can continuously generate trigger signals that are received by the laser scanner and indicate a time at which the arm's position is measured.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: January 24, 2012
    Assignee: Hexagon Metrology AB
    Inventor: Peter Champ
  • Publication number: 20110107614
    Abstract: A coordinate measurement device comprises an articulated arm and a laser scanner assembly. The articulated arm can have a first end, a second end, and a plurality of jointed arm segments therebetween. Each arm segment can define at least one axis of rotation, and a last axis of rotation can be defined by bearings near a distal end of the arm. The laser scanner assembly can couple to the distal end of the arm. The arm can continuously generate trigger signals that are received by the laser scanner and indicate a time at which the arm's position is measured.
    Type: Application
    Filed: March 26, 2010
    Publication date: May 12, 2011
    Applicant: HEXAGON METROLOGY AB
    Inventor: Peter Champ
  • Publication number: 20090205088
    Abstract: The present invention relates to a scanning probe (2) for capturing data from a plurality of points on the surface of an object by irradiating the object with a light stripe and detecting light reflected from the object surface, the scanning probe comprising (a) stripe generating means (14) for generating and emitting a light stripe (55); (b) a camera (16) comprising an imaging sensor having an array of pixels to detect the light stripe reflected from the object surface: (c) means for adjusting the intensity of the light stripe (55) during acquisition of the frame, in dependence upon the intensities detected by the camera (16). It also relates to a means to modify the stripe length, a scanner with separate compartment for the processing means, and an attachable dust cover for a scanner.
    Type: Application
    Filed: April 26, 2007
    Publication date: August 13, 2009
    Applicant: Metris N.V.
    Inventors: Stephen James Crampton, Peter Champ