Patents by Inventor Peter Chen-I Fang

Peter Chen-I Fang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Process for measuring nonlinear transition shift (NLTS) at high recording densities with a giant magetoresistive (GMR) head
    Patent number: 6788481
    Abstract: A nonlinear transition shift (NLTS) measurement procedure for read/write heads employing a giant magnetoresistive (GMR) merged heads. The method of this invention includes the pulse-shape distortion effects on recording nonlinearity, which can significantly affect the existing theoretical formulae for calculating nonlinearity correction factor from measured partial erasure values, and second-order approximation of equation of NLTS and nonlinearity correction factor. Transition broadening effects (TBE) and partial erasure (PE) are incorporated in the NLTS measurement procedure to permit accurate isolation of the NLTS from the unrelated TBE/PE and GMR nonlinear transfer characteristic (NTC). First, a fifth harmonic elimination (5HE) test is performed at bit period T to measure a first nonlinearity value X.
    Type: Grant
    Filed: March 21, 2002
    Date of Patent: September 7, 2004
    Assignee: International Business Machines Corporation
    Inventors: Peter Chen-I Fang, Xiangjun Feng, Terence Tin-Lok Lam, Zhong-Heng Lin