Abstract: A coupling unit is disclosed for detachable coupling two pars of a spacecraft, the coupling unit connecting the two parts of the spacecraft in a connected condition and the coupling unit distancing the two parts of the spacecraft, when the coupling unit is in detached condition. The coupling unit comprises a first element and a second element engaged to each other in connected condition, with the second element comprising a gas generator for generating gas under pressure to detach the first and the second element to bring them in the detached position, thereby distancing the first element and the second element from each other, and thus also the first part and the second part connected to the respective elements.

Abstract: The invention relates to a transmission charged particle microscope comprising a charged particle beam source for emitting a charged particle beam, a sample holder for holding a sample, an illuminator for directing the charged particle beam emitted from the charged particle beam source onto the sample, and a control unit for controlling operations of the transmission charged particle microscope. As defined herein, the transmission charged particle microscope is arranged for operating in at least two modes that substantially yield a first magnification whilst keeping said diffraction pattern substantially in focus. Said at least two modes comprise a first mode having first settings of a final projector lens of a projecting system; and a second mode having second settings of said final projector lens.

Abstract: The disclosure relates to a method of determining an energy width of a charged particle beam, comprising the steps of providing a charged particle beam, directing said beam towards a specimen, and forming an energy-dispersed beam from a flux of charged particles transmitted through the specimen. As defined herein, the method comprises the steps of providing a slit element in a slit plane, and using said slit element for blocking a part of said energy-dispersed beam, as well as the step of modifying said energy-dispersed beam at the location of said slit plane in such a way that said energy dispersed beam is partially blocked at said slit element. The unblocked part of said energy-dispersed beam is imaged and an intensity gradient of said imaged energy-dispersed beam is determined, with which the energy width of the charged particle beam can be determined.

Abstract: Methods and systems for identifying anatomical phrases in medical text. Methods and systems described herein use a syntactic approach to generate lists of relevant terms and define a grammar on these terms. Methods and systems described then search for phrases in text that conform to the grammar.

Abstract: A milking system includes a milking device, a milk line, and a sampling and analysis device for the milk that includes a control unit, a tape mover to move and unwind a tape wound on a tape reel and with a base material with reagent pads, that detect a substance in the sample, and a dosing device to provide the sample onto a reagent pad, and a sensor to detect radiation from said reagent pad, and to analyse the detected radiation to indicate a presence or concentration of said substance. The reagent pad is facing downward during provision of the sample. In this way, the chance of excess liquid falling from the reagent, and possibly onto a camera, is reduced. Smaller reagent pads may be used, it reduces the chance of supplied liquid spilling over to a neighbouring reagent pad, the measures preventing this spilling may be limited, and it is easier to suck away excess fluid.

Abstract: A milking system includes a milking device with a milking control, a milk line, and a sampling/analysis device. The milking control controls the milking based on said analysis. The sampling/analysis device includes a reagent carrier, including a tape with a first side with a reagent pad that detects the presence of a substance in the milk sample and a second side, a dosing device to provide a droplet of said sample onto the reagent pad, a source for emitting source radiation onto the reagent pad, and a sensor to detect response radiation emitted by the reagent pad, and to analyse the detected response radiation to indicate the presence or concentration of said substance. The first side faces away from the sensor during analysing by the sensor. By viewing “from below”, the observed reaction in the reagent is cleaner, and suffers less from artefacts, and the camera will stay cleaner.

Abstract: The present invention relates to a sound and vibration sensor comprising pressure generating arrangement adapted to generate pressure variations in a first and a second rear volume in response to vibrations of the sound and vibration sensor, the pressure generating arrangement comprising a moveable mass secured to a suspension member, and a first and a second pressure detecting arrangement, wherein the first and second pressure detecting arrangements are acoustically connected to a front volume of the sound and vibration sensor, and wherein each front volume is acoustically connected to the exterior of the sound and vibration sensor via a sound inlet, wherein the first pressure detecting arrangement is acoustically connected to the first rear volume, and that the second pressure detecting arrangement is acoustically connected to the second rear volume. The present invention further relates to a personal audio device comprising a sound and vibration sensor.

Abstract: The invention relates to a system for sensor protection in electron imaging applications comprising a beam control device configured to provide a beam signal based on an incoming beam signal, wherein the beam signal comprises an altered beam intensity, wherein the beam control device is further configured to receive a control signal and to activate based on the control signal. The system further comprises a sensor configured to capture the beam signal and to provide a capture signal based on the beam signal, and a control module configured to provide the control signal to the beam control device, to generate an exposure value based on the capture signal and to modify the control signal based on the exposure value.

Abstract: A method for reducing throughput time in a sample image acquisition session in transmission electron microscopy comprises: providing an electron microscope comprising a sample component, a beam generator, an adjusting component, and a filtering component; securing a sample by using the sample component; generating an electron beam by using the beam generator; generating an image beam by directing the beam to the sample component; adjusting at least one of the beam and the image beam by using the adjusting component to obtain at least one modified image beam, wherein the adjusting is performed in such a way, that off-axial aberration of the modified image beam is minimized; and filtering the modified image beam via the filtering component to reduce resolution-deteriorating effect of chromatic aberration on the modified image beam resulting from the adjusting of the at least one of the beam and the image beam.

Abstract: A method for electron microscopy comprises: adjusting at least one of an electron beam and an image beam in such a way that off-axial aberrations inflicted on at least one of the electron beam and the image beam are minimized, the adjusting performed by using a beam adjusting component to obtain at least one modified image beam, wherein the adjusting comprises applying both shifting and tilting to at least one of the electron beam and the image beam and wherein the amount of tilting of at least one of the electron beam and the image beam depends on the amount of shifting of at least one of the electron beam and the image beam respectively and wherein the amount of tilting is computed based on at least one of coma and astigmatism introduced as a consequence of the shift.

Abstract: An electron optical module for providing an off-axial electron beam with a tunable coma, according to the present disclosure includes a structure positioned downstream of an electron source and an electron lens assembly positioned between the structure and the electron source. The structure generates a decelerating electric field, and is positioned to prevent the passage of electrons along the optical axis of the electron lens assembly. The electron optical module further includes a micro-lens that is not positioned on the optical axis of the electron lens assembly and is configured to apply a lensing effect to an off-axial election beam. Aberrations applied to the off-axial electron beam by the micro-lens and the electron lens assembly combine so that a coma of the off-axial beam has a desired value in a downstream plane.

Abstract: A device for processing a flow of particulate material by contact with a gas flow includes a housing defining a processing chamber. This chamber includes a gas distribution plate having openings. The gas distribution plate separates a lower gas plenum from a solid-gas contact zone. The contact zone has at least one cylindrical partition upstanding from the gas distribution plate dividing an inner section from an adjacent annular outer section. The at least one partition is provided with a transfer opening for the particulate material. The housing is also provided with an inlet for supplying particulate material to the inner section and an outlet for discharging processed particulate material from the annular outer section.

Abstract: A micro-electromechanical transducer including one or more moveable members, and a viscoelastic substance having a predetermined viscoelasticity, the viscoelastic substance being adapted to influence the response of the transducer in a predetermined manner. The micro-electromechanical transducer of the present invention may include a MEMS transducer, such as a MEMS microphone, a MEMS vibration sensor, a MEMS acceleration sensor, a MEMS receiver.

Abstract: A method for electron microscopy comprises: adjusting at least one of an electron beam and an image beam in such a way that off-axial aberrations inflicted on at least one of the electron beam and the image beam are minimized, the adjusting performed by using a beam adjusting component to obtain at least one modified image beam, wherein the adjusting comprises applying both shifting and tilting to at least one of the electron beam and the image beam and wherein the amount of tilting of at least one of the electron beam and the image beam depends on the amount of shifting of at least one of the electron beam and the image beam respectively and wherein the amount of tilting is computed based on at least one of coma and astigmatism introduced as a consequence of the shift.

Abstract: An electron optical module for providing an off-axial electron beam with a tunable coma, according to the present disclosure includes a structure positioned downstream of an electron source and an electron lens assembly positioned between the structure and the electron source. The structure generates a decelerating electric field, and is positioned to prevent the passage of electrons along the optical axis of the electron lens assembly. The electron optical module further includes a micro-lens that is not positioned on the optical axis of the electron lens assembly and is configured to apply a lensing effect to an off-axial election beam. Aberrations applied to the off-axial electron beam by the micro-lens and the electron lens assembly combine so that a coma of the off-axial beam has a desired value in a downstream plane.

Abstract: The invention relates to a method for electron microscopy. The method comprises providing an electron microscope, generating an electron beam and an image beam, adjusting one of the beam and of the beam and the image beam to reduce off-axial aberrations and correcting a diffraction pattern of the resulting modified beam. The invention also relates to a method for reducing throughput time in a sample image acquisition session in transmission electron microscopy. The method comprises providing an electron microscope, generating a beam and an image beam, adjusting one of the two to reduce off-axial aberrations and filtering the resulting modified image beam. The invention further relates to an electron microscope and to a non-transient computer-readable medium with a computer program for carrying out the methods.

Abstract: An energy spectrometer with dynamic focus for a transmission electron microscope (TEM) is disclosed herein. An example energy spectrometer and TEM at least includes a charged particle column including a projection system arranged after a sample plane, the projection system is operated in a first configuration; an energy spectrometer coupled to the charged particle column to acquire one or more energy loss spectra. The energy spectrometer including a dispersive element, a bias tube, optics for magnifying the energy loss spectrum and for correcting aberrations, and a detector arranged conjugate to a spectrum plane of the energy spectrometer, wherein the energy spectrometer further includes an optical element electrically biased to refocus at least a portion of a spectrum onto the detector, and wherein the value of the electrical bias is at least partially based on the first configuration of the charged particle column.

Abstract: Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.

Abstract: An adjustable magnetic field free objective lens for a charged particle microscope is disclosed herein. An example charged particle microscope at least includes first and second optical elements arranged on opposing sides of a sample plane, a third optical element arranged around the sample plane, and a controller coupled to control the first, second and third optical elements. The controller coupled to excite the first and second optical elements to generate first and second magnetic lenses, the first and second magnetic lenses formed on opposing sides of the sample plane and oriented in the same direction, and excite the third optical element to generate a third magnetic lens at the sample plane that is oriented in an opposite direction, where a ratio of the excitation of the third optical element to the excitation of the first and second optical elements adjusts a magnetic field at the sample plane.

Abstract: A micro-electromechanical transducer including one or more moveable members, and a viscoelastic substance having a predetermined viscoelasticity, the viscoelastic substance being adapted to influence the response of the transducer in a predetermined manner. The micro-electromechanical transducer of the present invention may include a MEMS transducer, such as a MEMS microphone, a MEMS vibration sensor, a MEMS acceleration sensor, a MEMS receiver.