Abstract: A new method and apparatus is described for the improved analysis (physical or chemical) of objects. Photogrammetry and computer-readable fiducial markers are used to produce electronic files that constitute a digital twin of the specimen being analyzed. This aids communication and discussion about where on the specimen to analyze, and allows multiple analytical techniques to be applied using a common coordinate system, thereby aiding correlative microscopy. Additionally, a method and software which we call PARS (Portable Analytical Registration Software) that allows points defined by one computer-operated imaging instrument to be found easily in another computer-operated imaging instrument, without needing access or changes to the software running each instrument. This methodology makes it possible to correlate images from many surface imaging techniques to provide an unprecedented level of surface detail on a potentially nanometer scale that no one technique can provide alone.

Abstract: A process for producing x-ray photoelectron spectra of a sample comprising the steps of: producing a plurality of different oxidation states of the sample in a surface thereof by exposing the sample surface to an agent configured to change the oxidation state of said sample surface; placing the sample in an x-ray photoelectron spectroscopy apparatus; obtaining an x-ray photoelectron spectra for each of the plurality of oxidation states of the said sample surface; identifying materials within the sample by analysing the plurality of spectra.

Abstract: Disclosed is a tip for use in atomic force microscopy. The tip includes a substrate and a three-dimensional, double-stranded nucleic acid structure attached thereto. The nucleic acid structure may have a single-stranded nucleic acid attached thereto, such as an aptamer sequence. In use, the tip having the nucleic acid structure can be brought into contact with a surface to be imaged.

Abstract: A calibration device is disclosed. A platform has a substantially planar surface suitable for the landing of an AFM cantilever tip, one or more supporting legs arranged to provide sprung resistance to the platform and a capacitive sensor for measuring the combined spring constant of the one or more supporting legs with respect to displacement substantially perpendicular to said substantially planar surface.

Abstract: A calibration device and method for lateral force calibration in small force measuring devices such as atomic force microscopes is disclosed. A platform has a substantially planar surface including a slot for accommodating at least part of the AFM cantilever tip, one or more supporting legs arranged to provide sprung resistance to the platform and a capacitive drive means for driving the platform laterally with respect to the AFM cantilever tip.