Abstract: A gun safety device mounted on a gun which automatically prevents the gun from firing when it detects an object is in close proximity to the barrel of the gun. The safety device having a proximity detection system and a data processing device for identifying whether the gun is pointed at a close object, and for generating a disable signal when the gun is identified to be pointed at a near object, and a safety seizer operable to prevent the gun from discharging in response to receiving the disable signal from the data processing device.

Abstract: An enhanced probe plate assembly for a circuit board test fixture is disclosed. A conductive surface or surfaces is laminated to the underside of a probe plate assembly located between an electrical test system and circuit board under test. These conductive surface(s) of the probe plate assembly provide an improved interface between the signal probes and personality pins of the circuit board test fixture and can be used for grounding planes, voltage sources, and common interconnection grids. The enhanced probe plate assembly results in increased signal quality due to reduced signal path length, less crosstalk and signal loss between personality pin and signal probe connections, and perfect alignment of personality pins and signal probes through the conductive surface. It is emphasized that this abstract is provided to comply with the rules requiring an abstract, which will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure.

Abstract: An enhanced probe plate assembly for a circuit board test fixture is disclosed. A conductive surface or surfaces is laminated to the underside of a probe plate assembly located between an electrical test system and circuit board under test. These conductive surface(s) of the probe plate assembly provide an improved interface between the signal probes and personality pins of the circuit board test fixture and can be used for grounding planes, voltage sources, and common interconnection grids. The enhanced probe plate assembly results in increased signal quality due to reduced signal path length, less crosstalk and signal loss between personality pin and signal probe connections, and perfect alignment of personality pins and signal probes through the conductive surface. It is emphasized that this abstract is provided to comply with the rules requiring an abstract, which will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure.