Patents by Inventor Peter E. Raad

Peter E. Raad has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7444260
    Abstract: A system and method to fully characterize the thermal behavior of complex 3D submicron electronic devices. The system replaces and/or supplements laser-based surface temperature scanning with a CCD camera-based approach. A CCD camera records multiple points of light energy reflected from an integrated circuit to obtain a temperature measurement. The system is used to non-invasively measure with submicron resolution the 2D surface temperature field of an activated device. The measured 2D temperature field is used as input for an ultra-fast inverse computational solver. The system couples measured results and computations in a novel approach, making it possible to extract geometric and thermal features of a device, and to obtain critically needed temperature distributions over the entire 3D volume of that device, including regions that are physically or optically inaccessible. The obtained distributions reflect the real, and not merely theoretical, physical construction and thermal behavior of that device.
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: October 28, 2008
    Inventor: Peter E. Raad
  • Publication number: 20080082288
    Abstract: A system and method to fully characterize the thermal behavior of complex 3D submicron electronic devices. The system replaces and/or supplements laser-based surface temperature scanning with a CCD camera-based approach. A CCD camera records multiple points of light energy reflected from an integrated circuit to obtain a static temperature measurement. The system is used to non-invasively measure with submicron resolution the 2D surface temperature field of an activated device. A CW laser illuminates a single point on the surface of an active device and a photodetector records the reflected light energy to obtain a transient temperature measurement. The measured 2D temperature field is used as input for an ultra-fast inverse computational solution to fully characterize the thermal behavior of the complex 3D device. The system extracts geometric features of a known device, assessing the system's ability to combine measured results and computations to fully characterize complex 3D electronic devices.
    Type: Application
    Filed: September 28, 2006
    Publication date: April 3, 2008
    Inventor: Peter E. Raad
  • Patent number: 6064810
    Abstract: A system (2) predicts the behavior of a component using refinements in both space and time. The system (2) includes a steady-state engine (14) that generates a steady-state stencil (16) that defines successively refined meshes (58, 60, 90, 118, 122) in space. A transient engine (18) adopts the spatial framework of the steady-state stencil (16) to predict the behavior of the component over time. The transient engine (18) may adjust a time interval (356) to refine the predictions in time.
    Type: Grant
    Filed: September 27, 1996
    Date of Patent: May 16, 2000
    Assignees: Southern Methodist University, Texas Instruments Incorporated
    Inventors: Peter E. Raad, James S. Wilson, Donald C. Price