Abstract: The invention relates to sensors, and more particularly, a sensor device having accelerometer and gyroscope integrated into a low cost compact package. The device includes: MEMs wafer; and an ASIC wafer bonded to the MEMs wafer; a wafer-level-package redistribution layer (WLP RDL) formed on a surface of the ASIC wafer; and a ball grid array having a plurality of solder balls that electrically connect the package to a circuit board. The MEMs wafer includes the accelerometer and gyroscope, while the ASIC wafer includes two separate cavities corresponding to the accelerometer and gyroscope, respectively. The ASIC wafer includes electrical circuits/components to process the readout signals received from the accelerometer and gyroscope.

Abstract: There is provided a method (10) of forming concrete (36). The method (10) comprises the steps of providing cement (12) and providing water (16). The method (10) further comprises the step of mixing the cement (12) and the water (16) to form a cement-based mixture (20). The method (10) further comprises the step of, after forming the cement-based mixture (20), applying the cement-based mixture (20) to an aggregate (32) laid on a surface (34) to form the concrete (36).

Abstract: A ball grid array (BGA) includes a plurality of metal balls adapted for connection between an electrical circuit and a substrate. A first portion of the BGA contains a first group of the metal balls arranged according to a first pitch. A second portion of the BGA contains a second group of metal the balls arranged according to a second pitch that is less than the first pitch, to provide increased metal contact area and correspondingly enhanced thermal transfer capability.

Abstract: A ball grid array (BGA) includes a plurality of metal balls adapted for connection between an electrical circuit and a substrate. A first portion of the BGA contains a first group of the metal balls arranged according to a first pitch. A second portion of the BGA contains a second group of metal the balls arranged according to a second pitch that is less than the first pitch, to provide increased metal contact area and correspondingly enhanced thermal transfer capability.

Abstract: A flip chip in accordance with an exemplary embodiment of the present invention has a ball grid array and a die disposed on the ball grid array, wherein the ball grid array includes conducting pads disposed under the die. Traces connecting conducting pads under the die are accessible to leads on the die by way of a solder mask window. These traces continue through the solder mask window and extend out to the border of the ball grid array and are used for both signaling purposes and electroplating purposes.

Abstract: According to one embodiment of the invention, a power system for a die comprises a plurality of supply voltage lines, a plurality of ground lines, a plurality of metallized rails, and a via. Each of the plurality of supply voltage lines are in communication with at least one supply voltage pad. Each of the plurality of ground lines are in communication with at least one ground pad. The plurality of ground lines are interlaced with the plurality of supply voltage lines. The plurality of metallized rails are disposed across the plurality of supply voltage lines and the plurality of ground lines. The via communicatively couples at least one of the plurality of metallized rails to at least one of the supply voltage lines or at least one of the ground lines.

Abstract: An integrated circuit is packaged, in one embodiment, by wire bonding to pads supported by tape. The tape also supports traces that run from the wire bonded location to a pad for solder balls. A heat spreader is thermally connected to the integrated circuit and is located not just in the area under the die but also extends to the edge of the package in the area outside the wire bonding location. This outer area is thermally connected to the area under the die by thermal bars that run between some of the wire bond locations. During the manufacturing of the package the heat spreader is connected to slotted rails by tie bars. During singulation, the tie bars are easily broken or sawed because they are significantly reduced in thickness from the thickness of the heat spreader as a whole.

Abstract: An inductive device (105) is formed above a substrate (225) having a conductive coil formed around a core (109). The coil comprises segments formed from a first plurality of bond wires (113) and a second plurality of bond wires (111). The first plurality of bond wires (113) extends between the core (109) and the substrate (225). Each of the first plurality of bond wires is coupled to two of a plurality of wire bond pads (117, 116). The second plurality of bond wires (111) extends over the core (109) and is coupled between two of the plurality of wire bond pads (117, 119). A shield (141) includes a portion that is positioned between the core (109) and the substrate (225).

Abstract: A semiconductor device has a large number of bond pads on the periphery for wirebonding. The semiconductor device has a module as well as other circuitry, but the module takes significantly longer to test than the other circuitry. A relatively small number of the bond pads, the module bond pads, are required for the module testing due, at least in part, to the semiconductor device having a built-in self-test (BIST) circuitry. The functionality of these module bond pads is duplicated on the top surface of and in the interior of the semiconductor device with module test pads that are significantly larger than the bond pads on the periphery. Having large pads for testing allows longer probe needles, thus increasing parallel testing capability. Duplicating the functionality is achieved through a test pad interface so that the module bond pads and the module test pads do not have to be shorted together.

Abstract: Closed-loop feedback control of (continuous) catalytic polymerisation, by regulating the introduction of a Chain Transfer Agent (CTA) to a reactor, and so polymer chain length formation; through responsive (on-line) MFI determination, of a reactor polymer sample, using an MFI measurement viscometer (70) with dual measurement dies (91, 93), for extended measurement range.