Patents by Inventor Peter Hennig

Peter Hennig has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160110816
    Abstract: Loss control inspections by an insurance company are facilitated by a system that includes a wearable data-gathering device worn by a loss control inspector while he/she conducts an inspection. Other aspects of the system may include a centralized report processor operated by the insurance company, and a mobile device (such as a smartphone) carried by the loss control inspector to relay data between the wearable data-gathering device and the centralized report processor. The loss control inspector may gather verbal and visual information via the wearable data-gathering device, guided by prompts originating from the centralized report processor. The prompts may cause the data to be gathered as required to complete sections of an inspection report format. The centralized report processor may automatically edit and assemble the data gathered via the wearable device to generate a completed inspection report.
    Type: Application
    Filed: October 20, 2014
    Publication date: April 21, 2016
    Inventors: Mary B. Cardin, Philip Peter Hennig, Jacob P. Makler, Tiffany L. Ryan, Larry S. Sherman, Robert J. Sullivan
  • Patent number: 6622101
    Abstract: Method for monitoring a quality of a plurality of particularly different technical product types which are produced in a quasi-parallel manufacturing process, the manufacturing method including several sequentially arranged manufacturing stations, and whereby a course of a state variable for at least one of the manufacturing stations is determined point-by-point and displayed, the method including determining as a first type number a number of product types to be monitored, determining technical product parameter which is affected in the at least one manufacturing station, allocating a measuring arrangement to the manufacturing station for measuring the technical product parameter for at least one of the monitored product types, taking a random sample of a product type whose physical state is modified in the manufacturing station, the random sample being taken the first type number of product types, determining measured values for the determined technical product parameter of the random sample, calculating an
    Type: Grant
    Filed: January 22, 2002
    Date of Patent: September 16, 2003
    Assignees: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung e.V., X-Fab Semiconductor Foundries AG.
    Inventors: Richard Oechsner, Thomas Tschaftary, Poitr Strzyzewski, Lothar Pfitzner, Claus Schneider, Peter Hennig