Patents by Inventor Peter Hinterdorfer

Peter Hinterdorfer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Topography and recognition imaging atomic force microscope and method of operation
    Patent number: 7152462
    Abstract: A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.
    Type: Grant
    Filed: June 14, 2005
    Date of Patent: December 26, 2006
    Assignee: Agilent Technologies, Inc
    Inventors: Peter Hinterdorfer, Jeremy Nelson, Stuart M. Lindsay
  • Topography and recognition imaging atomic force microscope and method of operation
    Publication number: 20060016251
    Abstract: A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.
    Type: Application
    Filed: June 14, 2005
    Publication date: January 26, 2006
    Inventors: Peter Hinterdorfer, Jeremy Nelson, Stuart Lindsay
  • Topography and recognition imaging atomic force microscope and method of operation
    Patent number: 6952952
    Abstract: A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.
    Type: Grant
    Filed: October 30, 2003
    Date of Patent: October 11, 2005
    Assignee: Molecular Imaging Corporation
    Inventors: Peter Hinterdorfer, Jeremy Nelson
  • Topography and recognition imaging atomic force microscope and method of operation
    Publication number: 20040129064
    Abstract: A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.
    Type: Application
    Filed: October 30, 2003
    Publication date: July 8, 2004
    Inventors: Peter Hinterdorfer, Jeremy Nelson