Abstract: Given a function F of a circuit having a data latching device and a feedback loop feeding an output Q of the device into logic which feeds the device, a method includes extracting at least one data independent case and clock-gating the device with the at least one data independent case. The method also includes eliminating the feedback loop if function F depends only on Q with a positive polarity or leaving the feedback loop if function F depends on Q in both positive and negative polarities.

Abstract: A data structure and corresponding search methods are disclosed for improving the performance of table lookups. A data structure for the table is employed using a single hash table with hash table entries pointing to tree fragments that are contiguous in main memory and can be efficiently loaded into a local data store or cache. Decision nodes are stored in a contiguous block of memory in a relative position based on the position of the decision node in the tree structure, including blank positions. Leaf nodes are stored in a contiguous block of memory based on the position of the leaf node in the tree structure, concatenating leaf nodes to eliminate blank positions. Leaf nodes of the tree fragments contain indicia of a data record, or indicia of another tree fragment. The data structure and corresponding search algorithm are employed for searches based on a longest prefix match in an internet routing table.

Abstract: The present invention relates to improvements concerning logic and timing verification as the testability of a hardware circuit comprising embeddings of dynamic logic circuits in a static environment. The clocked macros comprising the dynamic logic circuit are bounded at both input and output by latches, keeping input and output signals to the clocked macro static. The static input signals are processed with wave formatting means in order to generate a wave form usable for an evaluation by the dynamic logic circuit, and the dynamic logic output signal is converted back to a static signal by a set/reset latch such that it can be latched by the clock signal of the static embedding circuit. Thus, the analysis methods for timing and logic simulation during chip design can be the same as those used for static logic and, in particular, the LSSD testing methods can be used.

Abstract: The present invention relates to improvements concerning logic and timing verification as the testability of a hardware circuit comprising embeddings of dynamic logic circuits in a static environment. The clocked macros comprising the dynamic logic circuit are bounded at both input and output by latches, keeping input and output signals to the clocked macro static. The static input signals are processed with wave formatting means in order to generate a wave form usable for an evaluation by the dynamic logic circuit, and the dynamic logic output signal is converted back to a static signal by a set/reset latch such that it can be latched by the clock signal of the static embedding circuit. Thus, the analysis methods for timing and logic simulation during chip design can be the same as those used for static logic and, in particular, the LSSD testing methods can be used.