Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.

Abstract: A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.

Abstract: A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.

Abstract: An X-ray scattering apparatus has a sample holder for aligning and orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction towards the sample holder, a proximal X-ray detector arranged downstream of the sample holder as to let the direct X-ray beam pass and detect X rays scattered from the sample, and a distal X-ray detector arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam in which the proximal X-ray detector is also movable essentially along the propagation direction of the direct X-ray beam.

Abstract: An X-ray scattering apparatus has a sample holder for aligning and orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction towards the sample holder, a proximal X-ray detector arranged downstream of the sample holder as to let the direct X-ray beam pass and detect X rays scattered from the sample, and a distal X-ray detector arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam in which the proximal X-ray detector is also movable essentially along the propagation direction of the direct X-ray beam.

Abstract: The invention relates to a device for the delivery of a beam of X-rays for analysis of a sample (50), comprising: a source block (100) comprising X-ray emission means; an optical block (200) placed downstream of the source block (100), said optical block (200) comprising an optical monochromator component (210) having a reflecting surface (212) provided for conditioning X-rays emitted by the source block (100) according to unidimensional or bidimensional optical effect; and definition means (300) of X-rays comprising: an anti-diffusing member (310) for spatially delimiting X-rays conditioned by the optical monochromator component (210), placed downstream of the optical monochromator component (210) and comprising one or more plates (311) having portions (313) arranged to form a delimiting orifice (312), said portions (313) being coated with a monocrystalline material limiting the scattering of X-rays; a cut-off member (320) of X-rays emitted by the source block (100), comprising X-ray absorption means arr

Abstract: In a method for producing a replication master (10) having a surface with low roughness, comprising the steps of forming said master (10) such as to have a desired external surface shape corresponding to a counterform of a surface of an object (18, 20) to be produced by replication and treating said external surface of said master (10) to obtain a predetermined surface roughness value, it is proposed that said method furthermore comprises the step of coating at least a part of said master (10) with a soluble smoothening layer (16). The invention further relates to a replication master (10) for producing a smooth object (18, 20) having a low surface roughness, wherein at least a part of said master (10) is coated with a soluble smoothening layer (16).

Abstract: The invention refers to an X-ray beam device for X-ray analytical applications, comprising an X-ray source designed such as to emit a divergent beam of X-rays; and an optical assembly designed such as to focus said beam onto a focal spot, wherein said optical assembly comprises a first reflecting optical element, a monochromator device and a second reflecting optical element sequentially arranged between said source and said focal spot, wherein said first optical element is designed such as to collimate said beam in two dimensions towards said monochromator device, and wherein said second optical element is designed such as to focus the beam coming from said monochromator device in two dimensions onto said focal spot.

Abstract: The invention relates to a device for the delivery of a beam of X-rays for analysis of a sample (50), comprising: a source block (100) comprising X-ray emission means; an optical block (200) placed downstream of the source block (100), said optical block (200) comprising an optical monochromator component (210) having a reflecting surface (212) provided for conditioning X-rays emitted by the source block (100) according to unidimensional or bidimensional optical effect; and definition means (300) of X-rays comprising: an anti-diffusing member (310) for spatially delimiting X-rays conditioned by the optical monochromator component (210), placed downstream of the optical monochromator component (210) and comprising one or more plates (311) having portions (313) arranged to form a delimiting orifice (312), said portions (313) being coated with a monocrystalline material limiting the scattering of X-rays; a cut-off member (320) of X-rays emitted by the source block (100), comprising X-ray absorption means arr

Abstract: The invention relates to X-ray analytical instruments (RX), more precisely a device for providing a high energy X-ray beam, typically above 4 keV, for X-ray analysis applications. The device comprises an X-ray tube with a turning anode and an X-ray lens for shaping the beam.

Abstract: The invention relates to X-ray analytical instruments (RX), more precisely a device for providing a high energy X-ray beam, typically above 4 keV, for X-ray analysis applications. The device comprises an X-ray tube with a turning anode and an X-ray lens for shaping the beam.

Abstract: The invention refers to an X-ray beam device for X-ray analytical applications, comprising an X-ray source designed such as to emit a divergent beam of X-rays; and an optical assembly designed such as to focus said beam onto a focal spot, wherein said optical assembly comprises a first reflecting optical element, a monochromator device and a second reflecting optical element sequentially arranged between said source and said focal spot, wherein said first optical element is designed such as to collimate said beam in two dimensions towards said monochromator device, and wherein said second optical element is designed such as to focus the beam coming from said monochromator device in two dimensions onto said focal spot.

Abstract: The invention relates to a dual Ion Beam Sputtering method for depositing onto a substrate (S) material generated by the sputtering of a target (121-123) by a sputtering ion beam (110), said method comprising the operation of an assistance ion beam (130) directed onto said substrate in order to assist the deposition of material, said method being characterized in that during the operation of said assistance beam said sputtering beam is also operated in association with said assistance beam, and during said operation of the sputtering beam in association with the assistance beam the sputtering beam crosses a desired part of the assistance beam in order to transport contaminants associated to said desired part of the assistance beam away from said substrate.

Abstract: The invention relates to an optical device intended to treat an incident X-ray beam. The optical device comprises a monochromator and an optical element for conditioning the incident beam. The reflective surface of the optical element is able to produce a two-dimensional optical effect in order to adapt a beam in destination of the monochromator. The reflective surface of the optical element comprises a multilayer structure type surface that is reflective to X-rays. In particular, the reflective surface consists of a single surface shaped according to two curvatures corresponding to two different directions.

Abstract: The invention relates to an optical assembly with a laterally graded reflective multilayer whose reflecting surface reflects incident X-rays under low incidence angles to produce a two-dimensional optical effect. The reflecting surface comprises a single surface conformed along two curvatures corresponding to two different directions. The invention also relates to a manufacturing method of such an optical assembly. The method includes coating a substrate already having a curvature. The invention also relates to a device for generating and conditioning X-rays for applications for angle-dispersive X-ray reflectometry. The device includes the optical assembly connected to an X-ray source so that X-rays emitted by the source are conditioned along two dimensions so as to adapt the beam emitted by the source to the sample, with the X-rays having different angles of incidence on the sample under consideration.

Abstract: In a method for producing a replication master (10) having a surface with low roughness, comprising the steps of forming said master (10) such as to have a desired external surface shape corresponding to a counterform of a surface of an object (18, 20) to be produced by replication and treating said external surface of said master (10) to obtain a predetermined surface roughness value, it is proposed that said method furthermore comprises the step of coating at least a part of said master (10) with a soluble smoothening layer (16). The invention further relates to a replication master (10) for producing a smooth object (18, 20) having a low surface roughness, wherein at least a part of said master (10) is coated with a soluble smoothening layer (16).

Abstract: The invention relates to an optical device intended to treat an incident X-ray beam. The optical device comprises a monochromator and an optical element for conditioning the incident beam. The reflective surface of the optical element is able to produce a two-dimensional optical effect in order to adapt a beam in destination of the monochromator. The reflective surface of the optical element comprises a multilayer structure type surface that is reflective to X-rays. In particular, the reflective surface consists of a single surface shaped according to two curvatures corresponding to two different directions.