Patents by Inventor Peter J. Lindner

Peter J. Lindner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250172931
    Abstract: A method includes identifying at least one excursion corresponding to sensor data obtained from a manufacturing system, initiating an excursion screening process to screen the at least one excursion using an excursion screening model, wherein the excursion screening model is trained to classify the at least one excursion, and causing a screening output resulting from the screening process to be displayed on a user device.
    Type: Application
    Filed: November 27, 2023
    Publication date: May 29, 2025
    Inventors: Jimmy Iskandar, Michael D. Armacost, Peter J. Lindner, Michael Olstad, Malcolm Delaney
  • Publication number: 20250165591
    Abstract: A system configured to obtain current trace data associated with a substrate processing system and provide the trace data as input to a first predictive subsystem trained to detect anomalies using a first technique. Responsive to detecting an anomaly in the trace data, the system provides the trace data as input to a second predictive subsystem trained to detect anomalies using a second technique. Output data obtained from the first predictive subsystem and the second predictive subsystem is provided to a third predictive subsystem. Output data from the third predictive subsystem is obtained. The output data is reflective of a trace shape associated with the anomaly. Based on the trace shape, a type of issue that caused the anomaly in the trace data is identified.
    Type: Application
    Filed: November 20, 2023
    Publication date: May 22, 2025
    Inventors: Peter J. Lindner, Chih Wei Lin, Jimmy Iskandar, Michael D. Armacost
  • Publication number: 20240184858
    Abstract: An electronic device manufacturing system configured to obtain, by a processor, a plurality of datasets associated with a process recipe, wherein each dataset of the plurality of datasets comprises data generated by a plurality of sensors during a corresponding process run performed using the process recipe. The processor is further configured to determine, using the plurality of data sets associated with the process recipe, a correlation value between two or more sensors of the plurality of sensors. Responsive to the correlation value satisfying a threshold criterion, the processor assigns the two or more sensors to a cluster. During a subsequent process run, the processor generates an anomaly score associated with the cluster and indicative of an anomaly associated with at least one step of the subsequent process run.
    Type: Application
    Filed: December 5, 2022
    Publication date: June 6, 2024
    Inventors: Peter J. Lindner, John G. Albright, Jimmy Iskandar, Michael D. Armacost