Patents by Inventor Peter J. Sedivec

Peter J. Sedivec has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7787134
    Abstract: Systems and techniques for laser metrology. Two or more fanned probe beams are scanned relative to a surface including one or more targets. A position detection module receives return beam information from the fanned probe beams, and determines a position of at least a first target of the one or more targets based on the return beam information.
    Type: Grant
    Filed: April 19, 2006
    Date of Patent: August 31, 2010
    Assignee: The Boeing Company
    Inventors: Kirk Kohnen, Peter J. Sedivec, Douglas Bender, Gregory S. Becker, John Y. Liu, Richard W. Guthrie, Ketao Liu, Ray McVey, Mark A. Lundgren
  • Patent number: 7547870
    Abstract: One or more fixed-orientation fanned laser beams and one or more displacement measurement devices to precisely measure the orientation of a payload platform are disclosed in a metrology system and method. The measurement devices may be distributed at locations across a payload platform such that displacement changes of these devices can be used to accurately determine platform pointing. Laser beam transmitters may be fixed in the same reference block to which a spacecraft attitude sensor is mounted. Fanned laser beams are transmitted from these sources to the measurement devices so that their displacements can be determined with respect to the plane of the fanned beams and thereby with respect to the spacecraft attitude sensor. Only a small number of fixed laser beams are needed to achieve precision measurements at a reduced cost, weight and power, and with increased system reliability and simplified system integration.
    Type: Grant
    Filed: April 10, 2006
    Date of Patent: June 16, 2009
    Assignee: The Boeing Company
    Inventors: Ketao Liu, Gregory S. Becker, Peter J. Sedivec, Douglas Bender
  • Patent number: 7450251
    Abstract: Systems and techniques for laser metrology. A system may include a laser source and a fanning apparatus configured to generate a fanned laser beam. The fanned laser beam may be scanned across the surface of an object, and may reflect off a plurality of targets positioned on the surface. A position detection module may determine a position of the metrology targets based on the reflected beam.
    Type: Grant
    Filed: November 9, 2005
    Date of Patent: November 11, 2008
    Assignee: The Boeing Company
    Inventors: Ketao Liu, Peter J. Sedivec, Douglas Bender, Gregory S. Becker, John Y. Liu, Richard W. Guthrie, Mark A. Lundgren