Abstract: An x-ray analysis apparatus comprises an electron beam assembly for generating a focused electron beam within a first gas pressure environment. A sample assembly is used for retaining a sample within a second gas pressure environment such that the sample receives the electron beam from the electron beam assembly and such that the gas pressure in the second gas pressure environment is greater than the gas pressure within the first gas pressure environment. An x-ray detector is positioned so as to have at least one x-ray sensor element within the first gas pressure environment. The sensor element is mounted to a part of the electron beam assembly which is proximal to the sample assembly and further arranged in use to receive x-rays generated by the interaction between the electron beam and the sample.

Abstract: An x-ray analysis apparatus comprises an electron beam assembly for generating a focused electron beam within a first gas pressure environment. A sample assembly is used for retaining a sample within a second gas pressure environment such that the sample receives the electron beam from the electron beam assembly and such that the gas pressure in the second gas pressure environment is greater than the gas pressure within the first gas pressure environment. An x-ray detector is positioned so as to have at least one x-ray sensor element within the first gas pressure environment. The sensor element is mounted to a part of the electron beam assembly which is proximal to the sample assembly and further arranged in use to receive x-rays generated by the interaction between the electron beam and the sample.

Abstract: An apparatus for detecting one or each of Kikuchi and Kossel diffraction patterns is provided. The apparatus comprises an electron column adapted in use to provide an electron beam (101) directed to wards a sample (102), the electron beam (101) having an energy in the range 2 keV to 50 keV, and a particle detector (111) for receiving and counting particles (103) from the sample (102) due to interaction of the electron beam (101) with the sample (102), the detector comprising an array of pixels (109) and having a count rate capability of at least 1000 particles per second for each pixel. The particle detector (111) is further adapted to provide electronic energy filtering of the received particles in order to count the received particles which are representative of the said diffraction pattern.

Abstract: An apparatus for detecting one or each of Kikuchi and Kossel diffraction patterns is provided. The apparatus comprises an electron column adapted in use to provide an electron beam (101) directed to wards a sample (102), the electron beam (101) having an energy in the range 2 keV to 50 keV, and a particle detector (111) for receiving and counting particles (103) from the sample (102) due to interaction of the electron beam (101) with the sample (102), the detector comprising an array of pixels (109) and having a count rate capability of at least 1000 particles per second for each pixel. The particle detector (111) is further adapted to provide electronic energy filtering of the received particles in order to count the received particles which are representative of the said diffraction pattern.

Abstract: A computer-implemented method of image processing for materials analysis is provided. At least three image datasets are obtained, these representing intensity values of image pixels and being in common spatial registration. The image datasets are processed so as to assign a comparison measure to each pair of image datasets, the comparison measure for a given pair of image datasets being representative of the difference between the spatial intensity information within the pair. A number of image datasets are then selected using the comparison measures. A colour difference measure is defined which represents the difference between pairs of colours of a colour set. Colours are assigned to the selected image datasets such that pairs of the selected image datasets which have substantially different spatial intensity information are assigned respective colours which have a substantially different colour difference measure.

Abstract: Apparatus for displaying a visual image of the X-ray response of a specimen comprises an electron beam source for exciting X-ray emissions from the specimen. A detector detects X-ray photons emitted by the specimen and generates output signals representing the energies of X-ray photons received from discrete pixels of the specimen in a plurality of energy bands. A set of look-up tables generate for each pixel and for each energy band visual colour component signals related to the mean energy of X-ray photons emitted from the pixel and detected by the detector in that energy band. The range of X-ray energies is mapped into a range of visual colours. An accumulator combines the colour component signals for each pixel. The colour components for each pixel are stored in a frame store which is connected to a monitor which displays an image defined by the colour components.