Patents by Inventor Peter John Hardman

Peter John Hardman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10871450
    Abstract: Described are various embodiments of a system, method and device for laser induced breakdown spectroscopy (LIBS). In some embodiments, the LIBS system comprises a silicon photomultiplier (Si PM) operated in a time-gated photon counting mode. Some such embodiments allow for the provision of a portable LIBS device. Also provided are embodiments for the measurement of constituent carbon, gold and/or other precious metal group elements in a target sample.
    Type: Grant
    Filed: October 20, 2017
    Date of Patent: December 22, 2020
    Assignee: NATIONAL RESEARCH COUNCIL OF CANADA
    Inventors: Paul Bouchard, Mohamad Sabsabi, Christian Padioleau, Rene Heon, Peter John Hardman
  • Publication number: 20190242826
    Abstract: Described are various embodiments of a system, method and device for laser induced breakdown spectroscopy (LIBS). In some embodiments, the LIBS system comprises a silicon photomultiplier (Si PM) operated in a time-gated photon counting mode. Some such embodiments allow for the provision of a portable LIBS device. Also provided are embodiments for the measurement of constituent carbon, gold and/or other precious metal group elements in a target sample.
    Type: Application
    Filed: October 20, 2017
    Publication date: August 8, 2019
    Applicant: NATIONAL RESEARCH COUNCIL OF CANADA
    Inventors: Paul BOUCHARD, Mohamad SABSABI, Christian PADIOLEAU, Rene HEON, Peter John HARDMAN
  • Publication number: 20120236989
    Abstract: A portable XRF analyzer includes a pressure measurement device disposed to measure the ambient air pressure and a processing subsystem responsive to a detector subsystem and the pressure measurement device. The processing subsystem is configured to calculate the concentration of at least one low atomic number element in the sample based on the intensity of the x-rays detected by the detector subsystem at an energy level corresponding to the element. The intensity value is corrected based on the ambient air pressure. An XRF method is also disclosed wherein the concentration of an element is determined automatically by taking into account the barometric pressure.
    Type: Application
    Filed: March 16, 2011
    Publication date: September 20, 2012
    Inventor: Peter John Hardman
  • Patent number: 7535989
    Abstract: An XRF system including an analyzer with a sample bottle holder, an x-ray source positioned to emit x-rays into a sample bottle placed in the holder, and a detector positioned to receive x-rays emitted by a sample in the sample bottle positioned in the sample bottle holder. A supply of sample bottles receivable in the sample bottle holder, each sample bottle including a first cap with the window therein for allowing x-rays to pass there through when the sample bottle is positioned in the holder, and a second cap without a window for transporting and storing the sample.
    Type: Grant
    Filed: October 17, 2006
    Date of Patent: May 19, 2009
    Assignee: Innov-X Systems, Inc.
    Inventors: Ronald H. Russell, Peter John Hardman, Bradley Hubbard-Nelson
  • Patent number: 7440541
    Abstract: A dual source tube XRF system and method wherein a first x-ray source is employed to direct x-rays in a first energy band at a sample and at least a second x-ray source is employed to direct x-rays in a second energy band at the sample. A detector is responsive to x-rays emitted by the sample after irradiation by the first and second x-ray sources. An analyzer is responsive to the detector and is configured to determine the amount of at least a first substance in the sample based on irradiation of the sample by the first x-ray source and to determine the amount of at least a second substance in the sample based on irradiation of the sample by the second x-ray source. A controller is responsive to the analyzer and is configured to energize the first and second x-ray sources either simultaneously or sequentially.
    Type: Grant
    Filed: December 27, 2006
    Date of Patent: October 21, 2008
    Assignee: Innov-X-Systems, Inc.
    Inventors: Bradley Hubbard-Nelson, Peter John Hardman
  • Publication number: 20080159474
    Abstract: A dual source tube XRF system and method wherein a first x-ray source is employed to direct x-rays in a first energy band at a sample and at least a second x-ray source is employed to direct x-rays in a second energy band at the sample. A detector is responsive to x-rays emitted by the sample after irradiation by the first and second x-ray sources. An analyzer is responsive to the detector and is configured to determine the amount of at least a first substance in the sample based on irradiation of the sample by the first x-ray source and to determine the amount of at least a second substance in the sample based on irradiation of the sample by the second x-ray source. A controller is responsive to the analyzer and is configured to energize the first and second x-ray sources either simultaneously or sequentially.
    Type: Application
    Filed: December 27, 2006
    Publication date: July 3, 2008
    Inventors: Brad Hubbard-Nelson, Peter John Hardman
  • Publication number: 20080089474
    Abstract: An XRF system including an analyzer with a sample bottle holder, an x-ray source positioned to emit x-rays into a sample bottle placed in the holder, and a detector positioned to receive x-rays emitted by a sample in the sample bottle positioned in the sample bottle holder. A supply of sample bottles receivable in the sample bottle holder, each sample bottle including a first cap with the window therein for allowing x-rays to pass there through when the sample bottle is positioned in the holder, and a second cap without a window for transporting and storing the sample.
    Type: Application
    Filed: October 17, 2006
    Publication date: April 17, 2008
    Inventors: Ronald H. Russell, Peter John Hardman, Bradley Hubbard-Nelson
  • Patent number: 7286633
    Abstract: A fuel analysis system and method wherein an x-ray source emits x-rays at an energy level below but proximate the absorption edge of sulfur. A monochromator is in the optical path between the source and a fuel sample for directing x-rays at a single energy level at the fuel sample to limit excitation of any sulfur in the fuel sample. A detector is responsive to x-rays emitted by the sample and an analyzer is responsive to the detector and configured to determine the amount of silicon and aluminum in the sample.
    Type: Grant
    Filed: October 24, 2006
    Date of Patent: October 23, 2007
    Assignee: Innov-X Systems, Inc.
    Inventors: Peter John Hardman, Bradley Hubbard-Nelson
  • Patent number: 6826253
    Abstract: An X-ray analysis apparatus for investigating material samples, comprising a device for automatic exchange of the samples (1), which comprises a sample table (2) with depositing positions (3) disposed in m lines, wherein the lines extend parallel to an x direction and m≧2, and comprising a gripping device (4) for precise removal of any desired sample (1) from a depositing position (3) and for transfer into a transfer and/or measuring position (5) and back to a depositing position (3), wherein the gripping device (4) can be displaced linearly parallel to the x direction, is characterized in that the sample table (2) can be moved linearly parallel to a y direction, extending at an angle &agr; to the x direction, and independently of the gripping device (4) for gripping samples (1) from different lines, wherein the sample table (2) is disposed parallel to the x-y plane.
    Type: Grant
    Filed: August 8, 2002
    Date of Patent: November 30, 2004
    Assignee: Bruker AXS GmbH
    Inventors: Michael Geoffrey Holmes Greenbank, Andrew Martin Watts, Peter John Hardman, Karl-Eugen Mauser
  • Patent number: 6823041
    Abstract: An X-ray analysis apparatus for investigating material samples, comprising a device for automatic exchange of the samples (1), which comprises a gripping device (4) for precise removal of any desired sample (1) from a depositing position (3) and for transfer into a transfer and/or measuring position and back to a depositing position (3), wherein at least some of the samples are surrounded by a sample holder (13;13′) in the peripheral direction, is characterized in that the samples or containers containing the samples project past the sample holder in the vertical z direction perpendicular to the horizontal x-y plane and that the gripping device is disposed and structured on a side of the sample to surround parts of a sample or of a sample container which project past the sample holder in an operating position in the z direction and to grasp the sample holder.
    Type: Grant
    Filed: August 8, 2002
    Date of Patent: November 23, 2004
    Assignee: Bruker AXS GmbH
    Inventors: Michael Geoffrey Holmes Greenbank, Andrew Martin Watts, Peter John Hardman, Karl-Eugen Mauser
  • Publication number: 20030048870
    Abstract: An X-ray analysis apparatus for investigating material samples, comprising a device for automatic exchange of the samples (1), which comprises a sample table (2) with depositing positions (3) disposed in m lines, wherein the lines extend parallel to an x direction and m≧2, and comprising a gripping device (4) for precise removal of any desired sample (1) from a depositing position (3) and for transfer into a transfer and/or measuring position (5) and back to a depositing position (3), wherein the gripping device (4) can be displaced linearly parallel to the x direction, is characterized in that the sample table (2) can be moved linearly parallel to a y direction, extending at an angle &agr; to the x direction, and independently of the gripping device (4) for gripping samples (1) from different lines, wherein the sample table (2) is disposed parallel to the x-y plane.
    Type: Application
    Filed: August 8, 2002
    Publication date: March 13, 2003
    Applicant: Bruker AXS GmbH
    Inventors: Michael Geoffrey Holmes Greenbank, Andrew Martin Watts, Peter John Hardman, Karl-Eugen Mauser
  • Publication number: 20030048871
    Abstract: An X-ray analysis apparatus for investigating material samples, comprising a device for automatic exchange of the samples (1), which comprises a gripping device (4) for precise removal of any desired sample (1) from a depositing position (3) and for transfer into a transfer and/or measuring position and back to a depositing position (3), wherein at least some of the samples are surrounded by a sample holder (13;13′) in the peripheral direction, is characterized in that the samples or containers containing the samples project past the sample holder in the vertical z direction perpendicular to the horizontal x-y plane and that the gripping device is disposed and structured on a side of the sample to surround parts of a sample or of a sample container which project past the sample holder in an operating position in the z direction and to grasp the sample holder.
    Type: Application
    Filed: August 8, 2002
    Publication date: March 13, 2003
    Applicant: Bruker AXS GmbH
    Inventors: Michael Geoffrey Holmes Greenbank, Andrew Martin Watts, Peter John Hardman, Karl-Eugen Mauser