Patents by Inventor Peter Joseph Codella
Peter Joseph Codella has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7652586Abstract: According to one embodiment, a first capacitive element may be provided and associated with a surface where a fouling layer is to be detected. A second capacitive element may also be provided, and a capacitance between the first and second capacitive elements may be used to detect formation of the fouling layer. According to another embodiment, a thermal device is provided proximate to a surface where a fouling layer is to be detected. A detector (e.g., a thermometer or vibration detector) may detect a condition associated with the surface, and formation of the fouling layer may be determined based at least in part on the condition.Type: GrantFiled: August 15, 2006Date of Patent: January 26, 2010Assignee: General Electric CompanyInventors: Marko Baller, Marcin Alexy, Glenn S. Claydon, Peter Joseph Codella, Stacey Kennerly, Kuna Kishore, Anis Zribi, Guiju Song, Shivappa Goravar, Ajit Achuthan
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Publication number: 20100007876Abstract: Embodiments of the invention include a method for sensing. Other embodiments include a method for sensing molecules, for example, homonuclear diatomic molecules. The method may include transmitting light from a light source through a hollow-core wave-guiding device that exhibits a low attenuation at predetermined operating optical frequencies; introducing a gaseous medium between the light source and the hollow-core wave-guiding device; and detecting molecules within the gas.Type: ApplicationFiled: September 18, 2009Publication date: January 14, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Rui Chen, Marko Klaus Baller, Peter Joseph Codella, Anis Zribi, Renato Guida, Alexey Vasily Vert, Radislav Alexandrovich Potyrailo, Xiaoyong Liu, Zhiyong Wang
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Patent number: 7627357Abstract: A method for determining analyte concentration levels is provided. The method includes acquiring radiation scattered off or transmitted by a target, analyzing at least a first portion of the radiation via a first technique to generate a first measurement of analyte concentration levels, and analyzing at least a second portion of the radiation via a second technique to generate a second measurement of analyte concentration levels. The method further determines analyte concentration levels based on at least one of the first measurement or the second measurement. In addition, a system for implementing the method and a probe for measuring and monitoring the analyte concentration levels is provided.Type: GrantFiled: June 30, 2005Date of Patent: December 1, 2009Assignee: General Electric CompanyInventors: Anis Zribi, Peter Joseph Codella, Min-Yi Shih, Ganesh Chandan Gangadharan, Rui Chen
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Publication number: 20090257055Abstract: Embodiments of the invention include a system for sensing homonuclear diatomic molecules, such as, for example, nitrogen. Other embodiments include a method for sensing homonuclear diatomic molecules. The system may include a light source, a hollow-core wave-guiding device that exhibits a low attenuation at predetermined operating optical frequencies and is in optical communication with the light source, a gas introduction system for introducing a gaseous medium between the light source and the hollow-core wave-guiding device, and a detector in optical communication with the hollow-core wave-guiding device.Type: ApplicationFiled: April 14, 2008Publication date: October 15, 2009Applicant: GENERAL ELECTRIC COMPANYInventors: Rui CHEN, Marko Klaus BALLER, Peter Joseph CODELLA, Anis ZRIBI, Renato GUIDA, Alexey Vasily VERT, Radislav Alexandrovich POTYRAILO, Xiaoyong LIU, Zhiyong WANG
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Patent number: 7595882Abstract: Embodiments of the invention include a system for sensing homonuclear diatomic molecules, such as, for example, nitrogen. Other embodiments include a method for sensing homonuclear diatomic molecules. The system may include a light source, a hollow-core wave-guiding device that exhibits a low attenuation at predetermined operating optical frequencies and is in optical communication with the light source, a gas introduction system for introducing a gaseous medium between the light source and the hollow-core wave-guiding device, and a detector in optical communication with the hollow-core wave-guiding device.Type: GrantFiled: April 14, 2008Date of Patent: September 29, 2009Assignee: Geneal Electric CompanyInventors: Rui Chen, Marko Klaus Baller, Peter Joseph Codella, Anis Zribi, Renato Guida, Alexey Vasily Vert, Radislav Alexandrovich Potyrailo, Xiaoyong Liu, Zhiyong Wang
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Publication number: 20080041139Abstract: According to one embodiment, a first capacitive element may be provided and associated with a surface where a fouling layer is to be detected. A second capacitive element may also be provided, and a capacitance between the first and second capacitive elements may be used to detect formation of the fouling layer. According to another embodiment, a thermal device is provided proximate to a surface where a fouling layer is to be detected. A detector (e.g., a thermometer or vibration detector) may detect a condition associated with the surface, and formation of the fouling layer may be determined based at least in part on the condition.Type: ApplicationFiled: August 15, 2006Publication date: February 21, 2008Inventors: Marko Baller, Marcin Alexy, Glenn S. Claydon, Peter Joseph Codella, Stacey Kennerly, Kuna Kishore, Anis Zribi, Guiju Song, Shivappa Goravar, Ajit Achuthan
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Publication number: 20040237888Abstract: An optical monitoring system for a plasma enhanced chemical vapor deposition (PECVD) apparatus includes a light source for generating an input light beam, and a first port configured within the PECVD apparatus for receiving the input light beam from the light source. The first port is configured to direct the input beam upon a workpiece within the PECVD apparatus. A second port is configured within the PECVD apparatus for receiving an output light beam passed through the workpiece, and a comparing mechanism for comparing the output light beam with the input light beam is configured to determine a deposited layer thickness upon the workpiece.Type: ApplicationFiled: May 30, 2003Publication date: December 2, 2004Applicant: General Electric CompanyInventors: Peter Joseph Codella, Manisha Tinani, George Theodore Dalakos, Eric Michael Breitung
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Patent number: 5706135Abstract: A structurally robust beamsplitter that has substantially constant transmittance values over a wide range of wavelengths includes a freestanding monolithic synthetic polycrystalline diamond optical plate that has a thickness in the range of about 1 .mu.m to about 1 mm. The optical plate further typically has a transmittance in the range between 55% and 75% for incident radiation over almost all wavelengths of radiation from the infrared to the visible. A beamsplitter in accordance with the present invention is readily adapted for use in a interferometric spectroscopy system, such as a system using infrared and far infrared radiation for spectroscopic analysis.Type: GrantFiled: October 3, 1995Date of Patent: January 6, 1998Assignee: General Electric CompanyInventor: Peter Joseph Codella