Patents by Inventor Peter Koudelka

Peter Koudelka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8120642
    Abstract: A swept distance between a subject and a plurality of cameras provides a plurality of raw images. Focused portions of the raw images are fused to generate a synthetic image and a distance image. A projection of the synthetic image and the distance image yields a panoramic image.
    Type: Grant
    Filed: July 25, 2008
    Date of Patent: February 21, 2012
    Assignee: Honeywell International Inc.
    Inventors: Jan Jelinek, Lubomir Koudelka, Peter Koudelka, Ryan Eckman, Daniel Blitz
  • Publication number: 20100020157
    Abstract: A swept distance between a subject and a plurality of cameras provides a plurality of raw images. Focused portions of the raw images are fused to generate a synthetic image and a distance image. A projection of the synthetic image and the distance image yields a panoramic image.
    Type: Application
    Filed: July 25, 2008
    Publication date: January 28, 2010
    Inventors: Jan Jelinek, Lubomir Koudelka, Peter Koudelka, Ryan Eckman, Daniel Blitz
  • Publication number: 20080074676
    Abstract: The present invention provides an inspection system for inspecting a surface of an optical specimen. The inspection system includes an optical testing device having a main body and an optical axis. The optical testing device includes an optical imaging system housed in the main body. The optical imaging system includes imaging components for acquiring a microscope visual image and for acquiring at least one interference fringe image of the surface of the optical specimen. The optical testing device also includes a translational mechanism housed in the main body and configured to allow linear movement of the optical imaging system and to prevent off-axis movement of the optical imaging system.
    Type: Application
    Filed: November 9, 2007
    Publication date: March 27, 2008
    Applicant: PROMET INTERNATIONAL, INC.
    Inventors: Lubomir Koudelka, Steven Arnold, Peter Koudelka, Ryan Eckman, Eric Lindmark
  • Publication number: 20050206889
    Abstract: The present invention provides an inspection system for inspecting a surface of an optical specimen. The inspection system includes an optical testing device having a main body and an optical axis. The optical testing device includes an optical imaging system housed in the main body. The optical imaging system includes imaging components for acquiring a microscope visual image and for acquiring at least one interference fringe image of the surface of the optical specimen. The optical testing device also includes a translational mechanism housed in the main body and configured to allow linear movement of the optical imaging system and to prevent off-axis movement of the optical imaging system.
    Type: Application
    Filed: January 28, 2005
    Publication date: September 22, 2005
    Applicant: PROMET International, Inc.
    Inventors: Lubomir Koudelka, Steven Arnold, Peter Koudelka, Ryan Eckman, Eric Lindmark