Abstract: An illuminated suction device comprising a suction tube having a proximal end and a distal tip at a distal end thereof, an illumination assembly comprising at least one direct light source mounted on a flexible circuit and configured to emit light toward a target area external to the distal tip of the suction tube, and at least one heat sinking member extending along a portion of the suction tube, wherein the at least one light source mounted on the flexible circuit is mechanically and thermally connected to the at least one heat sinking member.

Abstract: An illuminated medical device including an outer housing including a handle, an operative portion extending from the outer housing, and an illumination assembly comprising at least one direct light source oriented to emit light radially away from the operative portion of the medical device at least one reflector configured to reflect light from the at least one direct light source toward a target area external to the outer housing, wherein the at least one direct light source is positioned so as to maintain an air gap between the operative portion and the at least one direct light source.

Abstract: An illuminated medical device including an outer housing including a handle, an operative portion extending from the outer housing, and an illumination assembly comprising at least one direct light source oriented to emit light radially away from the operative portion of the medical device at least one reflector configured to reflect light from the at least one direct light source toward a target area external to the outer housing, wherein the at least one direct light source is positioned so as to maintain an air gap between the operative portion and the at least one direct light source.

Abstract: An illuminated medical device comprising an outer housing, and an illumination assembly comprising at least one direct light source oriented to emit light radially away from a central axis of the medical device and at least one reflector configured to reflect light from the at least one direct light source toward a target area external to the outer housing.

Abstract: Disclosed herein are multispectral detection methods and systems that can be used with image-forming optics configured to form an image of a sample. The systems include: (a) an imaging detector; (b) relay optics that include multiple optical elements, the relay optics positioned to relay the image formed by the image-forming optics to the imaging detector; (c) an actuator coupled to one of the optical elements in the relay optics and configured to adjust a position of the coupled optical element; and (d) control electronics configured to cause the actuator to adjust the position of the coupled optical element in the relay optics in response to a wavelength band selection by a wavelength selection element positioned to select one wavelength band for the image from among two or more wavelength bands within an overall wavelength range.

Abstract: Disclosed herein are multispectral detection methods and systems that can be used with image-forming optics configured to form an image of a sample. The systems include: (a) an imaging detector; (b) relay optics that include multiple optical elements, the relay optics positioned to relay the image formed by the image-forming optics to the imaging detector; (c) an actuator coupled to one of the optical elements in the relay optics and configured to adjust a position of the coupled optical element; and (d) control electronics configured to cause the actuator to adjust the position of the coupled optical element in the relay optics in response to a wavelength band selection by a wavelength selection element positioned to select one wavelength band for the image from among two or more wavelength bands within an overall wavelength range.

Abstract: A method and apparatus are provided for determining the doping concentration profile of a specimen of semiconductor material. The apparatus includes a sensor assembly having a sensor tip which is mounted on an air bearing assembly. The air bearing assembly is suspended from a housing by a pair of bellows. In use, air is supplied to the air bearing assembly through the bellows causing the bellows to expand, lowering the sensor tip until the air bearing action stops the expansion. In other implementations of the invention, photocurrent or photovoltage are not used and the doping concentration profile is determined using the total capacitance, the capacitance of air, the DC bias voltage and the area of the electrode spaced from the specimen information.

Abstract: A method and apparatus are provided for determining the doping concentration profile of a specimen of semiconductor material. The specimen is positioned between a pair of electrodes, the specimen being disposed on one of the electrodes and being spaced form the other electrode by a nonconductive medium. In one implementation of the invention the nonconductive medium is air. A region of the surface of the specimen is illuminated with a beam of light of wavelengths shorter than that corresponding to the energy gap of the semiconductor material and which is intensity modulated at a predetermined frequency. A variable DC bias voltage is applied between the pair of electrodes, the variable DC bias voltage varying between that corresponding to accumulation and that corresponding to deep depletion for the specimen. The intensity of the light beam is low enough and the speed at which the DC bias voltage is varied is fast enough such that no inversion layer is formed at the surface of the specimen.

Abstract: A method for determining the doping concentration profile of a specimen of semiconductor material. The specimen is positioned between a pair of electrodes, the specimen being disposed on one of the electrodes and being spaced from the other electrode by an air gap. A signal is provided corresponding to the total capacitance between the two electrodes. A region of the surface of the specimen is illuminated with a beam of light of wavelengths shorter than that corresponding to the energy gap of the semiconductor material and which is intensity modulated at a predetermined frequency. A variable DC bias voltage is applied between the pair of electrodes, the variable bias voltage varying between that corresponding to accumulation and that corresponding to deep depletion for the specimen. The intensity of the light beam is low enough and the speed at which the DC bias voltage is varied is fast enough such that no inversion layer is formed at the surface of the specimen.

Abstract: A proximity mask alignment system includes a remotely-focusing microscope and a video frame storage device. When a first surface, such as an integrated circuit substrate, is in focus an image of the first surface is obtained and stored. Then, after the microscope is re-focused to a second surface, such as a photomask, the stored image of the first surface is superimposed onto the "live" image of the second surface. The two focal positions are stored, with a selected one being normally provided to the microscope. A user initiates an automatic sequence wherein the microscope focuses to the other focal position, stores an image obtained at the other focal position, then refocuses to the original focal position. The stored image is superimposed on the image currently being generated, enabling the user to simultaneous view each surface in sharp focus, facilitating the alignment of the two surfaces to one another.

Abstract: Apparatus is disclosed for the generation and display of interference patterns for the purpose of quantifying the distortion of either a surface or a transmitted wavefront. The invention comprises, in one embodiment, means to align the elements comprising the interferometer cavity, means to continuously magnify, i.e., zoom, the aperture diameter of the interference pattern, means to focus either the measured or limiting aperture onto the face of the vidicon, and means for transducing both the alignment spots and the interference pattern with a standard CCTV camera.