Abstract: A system for measuring photovoltaic cell conductive layer quality. The system can be integrated into a light IV cell tester and comprises an electrical sourcing and metering unit, capable to be coupled to a conductive layer of a cell via bus bars, and a conductive layer quality tester communicatively coupled to unit. The unit is capable to apply current to and collect current from the conductive layer as well as meter voltage across the layer. The tester comprises an equipment control engine capable to instruct the electrical sourcing and metering unit to apply and collect a current to the conductive layer and to meter voltage across the layer; a data acquisition engine capable to receive metered voltage data from the electrical sourcing and metering unit, and a data analysis engine capable to calculate resistance of the conductive layer based on applied current and metered voltage, and to calculate conductive layer quality based on the calculated resistance.