Patents by Inventor Peter Lex Alving

Peter Lex Alving has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10942282
    Abstract: The invention relates to a combined imaging detector for detection of gamma and x-ray quanta comprising an x-ray detector (31) for generating x-ray detection signals in response to detected x-ray quanta and a gamma detector (32) for generating gamma detection signals in response to detected gamma quanta. The x-ray detector (31) and the gamma detector (32) are arranged in a stacked configuration along a radiation-receiving direction (33). The gamma detector (32) comprises a gamma collimator plate (320) comprising a plurality of pinholes (321), and a gamma conversion layer (322, 324) for converting detected gamma quanta into gamma detection signals.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: March 9, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Herfried Karl Wieczorek, Johannes Wilhelmus Maria Jacobs, Herman Stegehuis, Alessandro Radaelli, Christiaan Kok, Peter Lex Alving
  • Patent number: 10788595
    Abstract: The present invention relates to an apparatus for imaging an object. It is described to receive (110) by at least a portion of first pixels of a first area (A, A1, A2, A3, A4, A5, A6, A7, A8) of an X-ray detector (20) first radiation emitted by at least one X-ray source (30). The X-ray detector is configured such that X-ray radiation received by a pixel leads to the generation of signal in that pixel. A plurality of first signals representative of corresponding signals on the plurality of first pixels are stored (120) in at least one first plurality of storage nodes associated with the first area. Second radiation emitted by the at least one X-ray source (30) is received (150) by at least a portion of second pixels of a second area (B, B1, B2, B3, B4, B5, B6, B7, B8; C) of the X-ray detector. A plurality of second signals representative of corresponding signals on the plurality of second pixels are stored (190) in at least one second plurality of storage nodes associated with the second area.
    Type: Grant
    Filed: February 21, 2017
    Date of Patent: September 29, 2020
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Peter Lex Alving, Heidrun Steinhauser, Herman Stegehuis
  • Publication number: 20190353802
    Abstract: An X-ray detector (100) and an X-ray imaging apparatus (500) with such X-ray detector (100) are provided. The X-ray detector (100) comprises at least three scintillator layers (102a-e) for converting X-ray radiation into scintillator light (110), and at least two sensor arrays (104a, 104b), each comprising a plurality of photosensitive pixels (108a, 108b) aranged on a bendable substrate (106a, 106b) for receiving scintillator light (110) emitted by at least one of the scintillator layers (102a-e). Therein, a number of the scintillator layers (102a-e) is larger than a number of the sensor arrays (104a, 104b).
    Type: Application
    Filed: December 24, 2017
    Publication date: November 21, 2019
    Inventors: HEIDRUN STEINHAUSER, ONNO JAN WIMMERS, PETER LEX ALVING, MATTHIAS SIMON
  • Patent number: 10448909
    Abstract: The invention relates to a combined imaging detector (110) for the detection of x-ray and gamma quanta. The combined imaging detector (110) is adapted for simultaneous detection of gamma and x-ray quanta. The combined imaging detector (110) includes an x-ray anti-scatter grid (111), a layer of x-ray scintillator elements (112), a first photodetector array (113), a layer of gamma scintillator elements (114), and a second photodetector array (115) that are arranged in a stacked configuration along a radiation-receiving direction (116). The x-ray anti-scatter grid (111) comprises a plurality of septa (117A, B, C) that define a plurality of apertures (118) which are configured to collimate both x-ray quanta and gamma quanta received from the radiation receiving direction (116) such that received gamma quanta are collimated only by the x-ray anti-scatter grid (111). The use of the x-ray anti-scatter grid as a collimator for received gamma quanta results in a significantly lighter combined imaging detector.
    Type: Grant
    Filed: February 28, 2017
    Date of Patent: October 22, 2019
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Herfried Karl Wieczorek, Andreas Goedicke, Peter Lex Alving
  • Publication number: 20190243005
    Abstract: The invention relates to a combined imaging detector for detection of gamma and x-ray quanta comprising an x-ray detector (31) for generating x-ray detection signals in response to detected x-ray quanta and a gamma detector (32) for generating gamma detection signals in response to detected gamma quanta. The x-ray detector (31) and the gamma detector (32) are arranged in a stacked configuration along a radiation-receiving direction (33). The gamma detector (32) comprises a gamma collimator plate (320) comprising a plurality of pinholes (321), and a gamma conversion layer (322, 324) for converting detected gamma quanta into gamma detection signals.
    Type: Application
    Filed: September 6, 2017
    Publication date: August 8, 2019
    Applicant: KONINKLIJKE PHILIPS N.V.
    Inventors: Herfried Karl WIECZOREK, Johannes Wilhelmus Maria JACOBS, Herman STEGEHUIS, Alessandro RADAELLI, Christiaan KOK, Peter Lex ALVING
  • Patent number: 10371830
    Abstract: A radiation detector for combined detection of low-energy radiation quanta and high-energy radiation quanta has a multi-layered structure. A rear scintillator layer (5) is configured to emit a burst of scintillation photons responsive to a high-energy radiation quantum being absorbed by the rear scintillator layer (5). A rear photosensor layer (6) attached to a back side of the rear scintillator layer (5) is configured to detect scintillation photons generated in the rear scintillator layer (5). A front scintillator layer (3) arranged in front of the rear scintillator layer (5) opposite the rear photosensor layer (6) is configured to emit a burst of scintillation photons responsive to a low-energy radiation quantumbeing absorbed by the front scintillator layer (3). A front photosensor layer (2) attached to a front side of the front scintillator layer (3) opposite the rear scintillator layer (5) is configured to detect scintillation photons generated in the front scintillator layer (3).
    Type: Grant
    Filed: October 14, 2016
    Date of Patent: August 6, 2019
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Johannes Wilhelmus Maria Jacobs, Jorrit Jorritsma, Heidrun Steinhauser, Onno Jan Wimmers, Peter Lex Alving, Herman Stegehuis, Herfried Karl Wieczorek
  • Publication number: 20190090827
    Abstract: The invention relates to a combined imaging detector (110) for the detection of x-ray and gamma quanta. The combined imaging detector (110) is adapted for simultaneous detection of gamma and x-ray quanta. The combined imaging detector (110) includes an x-ray anti-scatter grid (111), a layer of x-ray scintillator elements (112), a first photodetector array (113), a layer of gamma scintillator elements (114), and a second photodetector array (115) that are arranged in a stacked configuration along a radiation-receiving direction (116). The x-ray anti-scatter grid (111) comprises a plurality of septa (117A, B, C) that define a plurality of apertures (118) which are configured to collimate both x-ray quanta and gamma quanta received from the radiation receiving direction (116) such that received gamma quanta are collimated only by the x-ray anti-scatter grid (111). The use of the x-ray anti-scatter grid as a collimator for received gamma quanta results in a significantly lighter combined imaging detector.
    Type: Application
    Filed: February 28, 2017
    Publication date: March 28, 2019
    Inventors: HERFRIED KARL WIECZOREK, ANDREAS GOEDICKE, PETER LEX ALVING
  • Publication number: 20190056517
    Abstract: The present invention relates to an apparatus for imaging an object. It is described to receive (110) by at least a portion of first pixels of a first area (A, A1, A2, A3, A4, A5, A6, A7, A8) of an X-ray detector (20) first radiation emitted by at least one X-ray source (30). The X-ray detector is configured such that X-ray radiation received by a pixel leads to the generation of signal in that pixel. A plurality of first signals representative of corresponding signals on the plurality of first pixels are stored (120) in at least one first plurality of storage nodes associated with the first area. Second radiation emitted by the at least one X-ray source (30) is received (150) by at least a portion of second pixels of a second area (B, B1, B2, B3, B4, B5, B6, B7, B8; C) of the X-ray detector. A plurality of second signals representative of corresponding signals on the plurality of second pixels are stored (190) in at least one second plurality of storage nodes associated with the second area.
    Type: Application
    Filed: February 21, 2017
    Publication date: February 21, 2019
    Applicant: KONINKLIJKE PHILIPS N.V.
    Inventors: PETER LEX ALVING, HEIDRUN STEINHAUSER, HERMAN STEGEHUIS
  • Publication number: 20180275289
    Abstract: A radiation detector for combined detection of low-energy radiation quanta and high-energy radiation quanta, the radiation detector (8) having a multi-layered structure, comprising: a rear scintillator layer (5) configured to emit a burst of scintillation photons responsive to a high-energy radiation quantum being absorbed by the rear scintillator layer (5); a rear photosensor layer (6) attached to a back side of the rear scintillator layer (5), said rear photosensor layer (6) configured to detect scintillation photons generated in the rear scintillator layer (5); a front scintillator layer (3) arranged in front of the rear scintillator layer (5) opposite the rear photosensor layer (6), said front scintillator layer (3) configured to emit a burst of scintillation photons responsive to a low-energy radiation quantumbeing absorbed by the front scintillator layer (3); and a front photosensor layer (2) attached to a front side of the front scintillator layer (3) opposite the rear scintillator layer (5), said fron
    Type: Application
    Filed: October 14, 2016
    Publication date: September 27, 2018
    Inventors: Johannes Wilhelmus Maria JACOBS, Jorrit JORRITSMA, Heidrun STEINHAUSER, Onno Jan WIMMERS, Peter Lex ALVING, Herman STEGEHUIS, Herfried Karl WIECZOREK
  • Patent number: 7103143
    Abstract: An X-ray examination apparatus includes an X-ray source, an X-ray detector and an exposure control system. The exposure control system is arranged to control the X-ray source so as to perform a test exposure at a low X-ray dose and to perform an X-ray exposure at a higher X-ray dose. The X-ray detector applies a control signal resulting from the test exposure to the exposure control system and the X-ray source is adjusted on the basis of this control signal. The X-ray exposure produces an X-ray image and the X-ray detector supplies an image signal representing this X-ray image. The exposure control system is arranged to adjust the X-ray detector to a low spatial resolution during the test exposure and to a high spatial resolution during the X-ray exposure. The X-ray detector preferably includes a sensor matrix having sensor elements arranged in columns and rows. The spatial resolution is adjusted by deriving the control signal and the image signal from large and small groups of sensor elements, respectively.
    Type: Grant
    Filed: May 12, 2005
    Date of Patent: September 5, 2006
    Assignee: Koninklijke Philips Electronics, N.V.
    Inventors: Peter Lex Alving, Albert Louw Faber
  • Patent number: 6895078
    Abstract: An X-ray examination apparatus includes an X-ray source, an X-ray detector and an exposure control system. The exposure control system is arranged to control the X-ray source so as to perform a test exposure at a low X-ray dose and to perform an X-ray exposure at a higher X-ray dose. The X-ray detector applies a control signal resulting from the test exposure to the exposure control system and the X-ray source is adjusted on the basis of this control signal. The X-ray exposure produces an X-ray image and the X-ray detector supplies an image signal representing this X-ray image. The exposure control system is arranged to adjust the X-ray detector to a low spatial resolution during the test exposure and to a high spatial resolution during the X-ray exposure. The X-ray detector preferably includes a sensor matrix having sensor elements arranged in columns and rows. The spatial resolution is adjusted by deriving the control signal and the image signal from large and small groups of sensor elements, respectively.
    Type: Grant
    Filed: March 24, 2003
    Date of Patent: May 17, 2005
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Peter Lex Alving, Albert Louw Faber
  • Publication number: 20040013229
    Abstract: An X-ray examination apparatus includes an X-ray source, an X-ray detector and an exposure control system. The exposure control system is arranged to control the X-ray source so as to perform a test exposure at a low X-ray dose and to perform an X-ray exposure at a higher X-ray dose. The X-ray detector applies a control signal resulting from the test exposure to the exposure control system and the X-ray source is adjusted on the basis of this control signal. The X-ray exposure produces an X-ray image and the X-ray detector supplies an image signal representing this X-ray image. The exposure control system is arranged to adjust the X-ray detector to a low spatial resolution during the test exposure and to a high spatial resolution during the X-ray exposure. The X-ray detector preferably includes a sensor matrix having sensor elements arranged in columns and rows. The spatial resolution is adjusted by deriving the control signal and the image signal from large and small groups of sensor elements, respectively.
    Type: Application
    Filed: March 24, 2003
    Publication date: January 22, 2004
    Inventors: Peter Lex Alving, Albert Louw Faber
  • Patent number: 6594339
    Abstract: An X-ray examination apparatus includes an X-ray source, an X-ray detector and an exposure control system. The exposure control system is arranged to control the X-ray source so as to perform a test exposure at a low X-ray dose and to perform an X-ray exposure at a higher X-ray dose. The X-ray detector applies a control signal resulting from the test exposure to the exposure control system and the X-ray source is adjusted on the basis of this control signal. The X-ray exposure produces an X-ray image and the X-ray detector supplies an image signal representing this X-ray image. The exposure control system is arranged to adjust the X-ray detector to a low spatial resolution during the test exposure and to a high spatial resolution during the X-ray exposure. The X-ray detector preferably includes a sensor matrix having sensor elements arranged in columns and rows. The spatial resolution is adjusted by deriving the control signal and the image signal from large and small groups of sensor elements, respectively.
    Type: Grant
    Filed: November 22, 2000
    Date of Patent: July 15, 2003
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Peter Lex Alving, Albert Louw Faber, Johannes Henricus Maria Joosten