Patents by Inventor Peter Meijles

Peter Meijles has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System, method and apparatus for calibrating inspection tools
    Patent number: 8374818
    Abstract: The present invention relates to systems and methods for examining a number of components that have been assembled onto a substrate. In general, the invention relates to the calibration of inspection tools for inspecting components on the substrate. In particular, the invention relates to the calibration of inspection tools for detecting the accuracy of the array pegs positions on an assembled HTA plate.
    Type: Grant
    Filed: December 21, 2009
    Date of Patent: February 12, 2013
    Assignee: Affymetrix, Inc.
    Inventor: Peter Meijles
  • APPARATUS FOR POLYMER SYNTHESIS
    Publication number: 20100298171
    Abstract: Novel processes are disclosed for the large scale preparation of arrays of polymer sequences wherein each array includes a plurality of different, positionally distinct polymer sequences having known monomer sequences. In one embodiment, two substrates are processed simultaneously in a reaction chamber, wherein the substrates are facing each other and in contact with a monomer solution. In a further embodiment, multiple rotating flow cells are used in combination with a photolysis equipment to synthesize wafers.
    Type: Application
    Filed: May 24, 2010
    Publication date: November 25, 2010
    Applicant: Affymetrix, INC.
    Inventors: Mohsen Shirazi, Adam Pawloski, Peter Meijles, Glenn H. McGall
  • SYSTEM, METHOD AND PRODUCT FOR CALIBRATING INSPECTION TOOLS
    Publication number: 20100161266
    Abstract: The present invention relates to systems and methods for examining a number of components that have been assembled onto a substrate. In general, the invention relates to the calibration of inspection tools for inspecting components on the substrate. In particular, the invention relates to the calibration of inspection tools for detecting the accuracy of the array pegs positions on an assembled HTA plate.
    Type: Application
    Filed: December 21, 2009
    Publication date: June 24, 2010
    Applicant: Affymetrix, INC.
    Inventor: Peter Meijles