Patents by Inventor Peter Panayi

Peter Panayi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Atom probe
    Patent number: 8513597
    Abstract: Aspects of the present invention are directed generally toward atom probe and three-dimensional atom probe microscopes. For example, certain aspects of the invention are directed -toward an atom probe or a three-dimensional atom probe that includes a sub-nanosecond laser to evaporate ions from a specimen under analysis and a reflectron for reflecting the ions. In further aspects of the invention, the reflectron can include a front electrode and a back electrode. At least one of the front and back electrodes can be capable of generating a curved electric field. Additionally, the front electrode and back electrodes can be configured to perform time focusing and resolve an image of a specimen.
    Type: Grant
    Filed: June 16, 2006
    Date of Patent: August 20, 2013
    Assignee: Cameca Instruments, Inc.
    Inventor: Peter Panayi
  • Reflectron
    Patent number: 8134119
    Abstract: A reflectron (1) for deflecting an ion from a specimen in a time-of-flight mass spectrometer comprises a front electrode (2) and a back electrode (3). At least one of the front and back electrodes (2, 3) is capable of generating a curved electric field. The front and back electrodes are configured to perform time focusing and resolve an image of a specimen.
    Type: Grant
    Filed: April 16, 2009
    Date of Patent: March 13, 2012
    Assignee: Cameca Instruments, Inc.
    Inventor: Peter Panayi
  • ATOM PROBE
    Publication number: 20100148060
    Abstract: Aspects of the present invention are directed generally toward atom probe and three-dimensional atom probe microscopes. For example, certain aspects of the invention are directed-toward an atom probe or a three-dimensional atom probe that includes a sub-nanosecond laser to evaporate ions from a specimen under analysis and a reflectron for reflecting the ions. In further aspects of the invention, the reflectron can include a front electrode and a back electrode. At least one of the front and back electrodes can be capable of generating a curved electric field. Additionally, the front electrode and back electrodes can be configured to perform time focusing and resolve an image of a specimen.
    Type: Application
    Filed: June 16, 2006
    Publication date: June 17, 2010
    Applicant: Imago Scientific Instruments Corporation
    Inventor: Peter Panayi
  • REFLECTRON
    Publication number: 20100006752
    Abstract: A reflectron (1) for deflecting an ion from a specimen in a time-of-flight mass spectrometer comprises a front electrode (2) and a back electrode (3). At least one of the front and back electrodes (2, 3) is capable of generating a curved electric field. The front and back electrodes are configured to perform time focusing and resolve an image of a specimen.
    Type: Application
    Filed: April 16, 2009
    Publication date: January 14, 2010
    Inventor: Peter Panayi