Patents by Inventor Peter R. McCann

Peter R. McCann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fiber optic wafer probe
    Patent number: 7298536
    Abstract: A fiber optic wafer probe that includes a fibre optic cable for approaching a device under test.
    Type: Grant
    Filed: September 7, 2005
    Date of Patent: November 20, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: Peter R. McCann, John T. Martin
  • Optical testing device
    Patent number: 7268533
    Abstract: A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).
    Type: Grant
    Filed: August 6, 2004
    Date of Patent: September 11, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: Daniel L. Harris, Peter R. McCann
  • Fiber optic wafer probe
    Patent number: 6970634
    Abstract: A fiber optic wafer probe that includes a fiber optic cable for approaching a device under test.
    Type: Grant
    Filed: May 4, 2001
    Date of Patent: November 29, 2005
    Assignee: Cascade Microtech, Inc.
    Inventors: Peter R. McCann, John T. Martin
  • Indexing rotatable chuck for a probe station
    Patent number: 6885197
    Abstract: A rotary chuck with indexed rotation promotes rapid rotation of a device under test and increases the productivity of a probe station on which the device is being tested. A device mounting member of a rotatable chuck is supported for rotation on a first surface of a base until a vacuum is applied drawing the device mounting member into contact with a second surface of the base and constraining the device mounting member against rotation.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: April 26, 2005
    Assignee: Cascade Microtech, Inc.
    Inventors: Daniel L. Harris, Peter R. McCann
  • Optical testing device
    Patent number: 6836135
    Abstract: A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).
    Type: Grant
    Filed: August 7, 2002
    Date of Patent: December 28, 2004
    Assignee: Cascade Microtech, Inc.
    Inventors: Daniel L. Harris, Peter R. McCann
  • Indexing rotatable chuck for a probe station
    Publication number: 20040217530
    Abstract: A rotary chuck with indexed rotation promotes rapid rotation of a device under test and increases the productivity of a probe station on which the device is being tested. A device mounting member of a rotatable chuck is supported for rotation on a first surface of a base until a vacuum is applied drawing the device mounting member into contact with a second surface of the base and constraining the device mounting member against rotation.
    Type: Application
    Filed: May 28, 2004
    Publication date: November 4, 2004
    Inventors: Daniel L. Harris, Peter R. McCann
  • Indexing rotatable chuck for a probe station
    Patent number: 6771090
    Abstract: The arrangement of test points on an integrated circuit (IC) undergoing testing in a probe station often requires rotation of the IC or the probes when performing a series of tests. A chuck with indexed rotation promotes rapid rotation of the device under test to a new test position and increases the productivity of the probe station. The device under test is mounted on a device mounting member that is affixed to a shaft rotationally mounted in a base. A resilient seal supports the device mounting member and forms a sealed chamber over a substantial part of the area of the device mounting member. Applying vacuum or pressure to the sealed chamber urges the device mounting member and base toward contact. The support provided by the resilient seal over substantial portion of device mounting member's diameter promotes stability and consistent planarity of the device mounting member without regard to the orientation of the shaft to device mounting member.
    Type: Grant
    Filed: June 24, 2002
    Date of Patent: August 3, 2004
    Assignee: Cascade Microtech, Inc.
    Inventors: Daniel L. Harris, Peter R. McCann
  • Optical testing device
    Publication number: 20030042889
    Abstract: A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).
    Type: Application
    Filed: August 7, 2002
    Publication date: March 6, 2003
    Inventors: Daniel L. Harris, Peter R. McCann
  • Indexing rotatable chuck for a probe station
    Patent number: 6483336
    Abstract: The arrangement of test points on an integrated circuit (IC) undergoing testing in a probe station often requires rotation of the IC or the probes when performing a series of tests. A chuck with indexed rotation promotes rapid rotation of the device under test to a new test position and increases the productivity of the probe station. The device under test is mounted on a device mounting member that is affixed to a shaft rotationally mounted in a base. A resilient seal supports the device mounting member and forms a sealed chamber over a substantial part of the area of the device mounting member. Applying vacuum or pressure to the sealed chamber urges the device mounting member and base toward contact. The support provided by the resilient seal over substantial portion of device mounting member's diameter promotes stability and consistent planarity of the device mounting member without regard to the orientation of the shaft to device mounting member.
    Type: Grant
    Filed: May 3, 2000
    Date of Patent: November 19, 2002
    Assignee: Cascade Microtech, Inc.
    Inventors: Daniel L. Harris, Peter R. McCann
  • Fiber optic wafer probe
    Publication number: 20020164145
    Abstract: A fibre optic wafer probe that includes a fibre optic cable for approaching a device under test.
    Type: Application
    Filed: May 4, 2001
    Publication date: November 7, 2002
    Inventors: Peter R. McCann, John T. Martin
  • Indexing rotatable chuck for a probe station
    Publication number: 20020153877
    Abstract: The arrangement of test points on an integrated circuit (IC) undergoing testing in a probe station often requires rotation of the IC or the probes when performing a series of tests. A chuck with indexed rotation promotes rapid rotation of the device under test to a new test position and increases the productivity of the probe station. The device under test is mounted on a device mounting member that is affixed to a shaft rotationally mounted in a base. A resilient seal supports the device mounting member and forms a sealed chamber over a substantial part of the area of the device mounting member. Applying vacuum or pressure to the sealed chamber urges the device mounting member and base toward contact. The support provided by the resilient seal over substantial portion of device mounting member's diameter promotes stability and consistent planarity of the device mounting member without regard to the orientation of the shaft to device mounting member.
    Type: Application
    Filed: June 24, 2002
    Publication date: October 24, 2002
    Inventors: Daniel L. Harris, Peter R. McCann