Abstract: An interfacial force microscope includes a differential-capacitance displacement sensor having a tip mounted on an oscillating member. The sensor generates displacement signals in response to oscillations of the member. A scanner is adjacent the sensor and supports a sample to be imaged. The scanner is actuable to move the sample relative to the sensor to bring the tip into intermittent contact with said sample as the member oscillates. A controller is in communication with the sensor and the scanner. The controller includes a sensor feedback circuit receiving the displacement signals and an AC setpoint signal. The AC setpoint signal has a frequency generally equal to the frequency at the peak of the displacement versus frequency curve of the sensor. The output of the sensor feedback circuit is applied to the sensor to oscillate the member. The controller also provides output to the scanner in response to the displacement signals to control the separation distance between the sensor and the sample.

Abstract: An interfacial force microscope includes a differential-capacitance displacement sensor having a tip mounted on an oscillating member. The sensor generates displacement signals in response to oscillations of the member. A scanner is adjacent the sensor and supports a sample to be imaged. The scanner is actuable to move the sample relative to the sensor to bring the tip into intermittent contact with said sample as the member oscillates. A controller is in communication with the sensor and the scanner. The controller includes a sensor feedback circuit receiving the displacement signals and an AC setpoint signal. The AC setpoint signal has a frequency generally equal to the frequency at the peak of the displacement versus frequency curve of the sensor. The output of the sensor feedback circuit is applied to the sensor to oscillate the member. The controller also provides output to the scanner in response to the displacement signals to control the separation distance between the sensor and the sample.

Abstract: An interfacial force microscope includes a differential-capacitance displacement sensor having a tip mounted on an oscillating member. The sensor generates displacement signals in response to oscillations of the member. A scanner is adjacent the sensor and supports a sample to be imaged. The scanner is actuable to move the sample relative to the sensor to bring the tip into intermittent contact with said sample as the member oscillates. A controller is in communication with the sensor and the scanner. The controller includes a sensor feedback circuit receiving the displacement signals and an AC setpoint signal. The AC setpoint signal has a frequency generally equal to the frequency at the peak of the displacement versus frequency curve of the sensor. The output of the sensor feedback circuit is applied to the sensor to oscillate the member. The controller also provides output to the scanner in response to the displacement signals to control the separation distance between the sensor and the sample.

Abstract: An interfacial force microscope includes a differential-capacitance displacement sensor having a tip mounted on an oscillating member. The sensor generates displacement signals in response to oscillations of the member. A scanner is adjacent the sensor and supports a sample to be imaged. The scanner is actuable to move the sample relative to the sensor to bring the tip into intermittent contact with said sample as the member oscillates. A controller is in communication with the sensor and the scanner. The controller includes a sensor feedback circuit receiving the displacement signals and an AC setpoint signal. The AC setpoint signal has a frequency generally equal to the frequency at the peak of the displacement versus frequency curve of the sensor. The output of the sensor feedback circuit is applied to the sensor to oscillate the member. The controller also provides output to the scanner in response to the displacement signals to control the separation distance between the sensor and the sample.

Abstract: A printed circuit board tester incorporating hardware for fast capacitive measurements. The circuit board tester includes a digital signal processor that can both source and measure test signals. It also includes an amplifier having an input and an output connected to probes that can contact points on the printed circuit board. In use, the board tester is configured to place a capacitor on the printed circuit board under test in the feedback path of the amplifier. The digital signal processor generates a stimulus signal to the capcitor and the output of the amplifier is passed to the digital signal processor. The digital signal processor uses an adaptive filtering approach to determine convergence of the measurement, thereby minimizing measurement time. The arrangement is flexible and can be reconfigured to measure both large and small values of capacitance.

Abstract: An apparatus and method for measuring high temperatures in a boiler transmits pulses of acoustic waves, from one side wall of the boiler to an opposite side wall thereof. Acoustic noise within the boiler, as well as the transmitted pulses of acoustic waves are received at the opposite side of the boiler. The received signal is digitized and compared to a digitized sample of the pulses during a time period which is more than the maximum transit time for the pulses between the side walls. A point of maximum correlation between the sample and the signal is taken as the arrival time for the pulse and is used to calculate the transit time of the pulse across the boiler. This transit time is used in turn to calculate the velocity of the pulses. The temperature can then be calculated as a function of the velocity, the molecular weight of the medium and the specific heat ratio of the medium. Each pulse has a modulated frequency between 500 and 3,000 Hz.

Abstract: An apparatus for measuring changes in the work function of a surface using a method devised by Kelvin and known as the "dynamic capacitor method". This apparatus comprises a system for monitoring and automatically regulating the vibration of a Kelvin probe reed assembly during variation of the experimental conditions. This system includes a piezo-ceramic crystal mounted on the probe support rod to detect the vibrations of the reed and a phase locked loop circuit which compares the signal from the piezo-ceramic detector with the signal of the reed drive coil, interprets a change in the reed resonance as a phase shift relative to the coil drive phase and then shifts the coil drive frequency to maintain the correct phase relationship.