Abstract: An ultra-high tilt cryotransfer holder is provided which is capable of rotating a specimen through a full 360.degree. tilt angle (180.degree. from horizontal in both clockwise and counterclockwise directions) without spillage of cryogenic liquid, and while maintaining proper protection and cooling of the specimen. The cryotransfer holder includes a holder body having a specimen tip and a source of cooling for the specimen tip. The specimen tip includes a specimen grid of a thermally conductive material which has a plurality of grid openings between crossing grid bars. The grid may be extended from the holder into a forward viewing position or retracted into a protected position within a cryoshield.

Abstract: An apparatus for recording electron images and diffraction patterns which can be automatically controlled via a computer, has improved precision, and has greater flexibility in acquiring and displaying specimen images is provided. The apparatus includes an electron microscope having a projection chamber, an electron scintillator in the projection chamber for converting a projected electron image into a light image, and a camera positioned adjacent to the projection chamber for acquiring the light image. The camera is rotatable about its optical (horizontal) axis so that desired features of the acquired image may be brought into alignment with the display device used to view them, such as for example, a CRT screen. By positioning the camera outside of the vacuum of the electron microscope projection chamber, problems associated with prior internally-mounted devices are avoided and the camera may be readily manually or automatically adjusted.

Abstract: An apparatus and a specimen holder adapted to permit simultaneous two-sided ion beam milling at very low angles of beam incidence, down to 0.degree., from both sides of the specimen is provided and includes a specimen holder for two-sided ion beam milling and a pedestal having at least one extending specimen support arm adapted to engage a peripheral edge of a specimen. The specimen is secured to the at least one specimen support arm, preferably, so as to permit ion beams to be directed at the first and second major surfaces of the specimen simultaneously at very low angles of incidence down to 0.degree.. Both rapid milling as well as a reduction in artifacts provide high quality specimens for transmission electron microscopy analysis.

Abstract: An ion beam milling system for the preparation of transmission electron microscope specimens suitable for atomic resolution imaging, particularly of III-V and II-VI compound semiconductors and their alloys, is described. The system includes ion beam sources and reactive molecular gas jets which may be operated in combination or separately, as appropriate. A new heated specimen holder, giving greatly increased reaction rates with the molecular gas jet, allows milling angles very close to zero.

Abstract: A specimen heating holder for side entry transmission electron microscopes is described. The holder permits specimen tilt about two orthogonal axes and has the capability of raising the specimen temperature to .about.1000.degree. C. A novel hinged electrical connection, resistant to fatigue, supplies, supplies power to a heater within the specimen cradle. Special low thermal conductivity cradle bearings minimize the required heater current and promote ease of assembly yet are sufficiently strong to make specimen loading easy.

Abstract: An improved specimen cooling holder for transmission electron microscopy is described. Low thermal conductivity pins near the specimen and an improved conductor/dewar connection reduce specimen vibration, providing improved image resolution. Multiple heaters facilitate accurate temperature control and bakeout procedures.

Abstract: An improved electron microscope anticontaminator having a conduction rod enclosed within an independent vacuum system and micropositioning capability is described. The micropositioning facility allows the use of unusually small apertures in the cold anticontaminator block with a consequent improvement in efficiency of function. A self-contained contact sensor provides immediate audible warning of contact between a specimen holder and the cold anticontaminator block, permitting the removal of the usual mechanical end-stops for the specimen tilt mechanism and allowing the maximum specimen movement possible at any time. The independent vacuum system in combination with a heater positioned close to the anitcontaminator block allows the microscopist to vent the microscope column without removing the anticontaminator from the microscope.

Abstract: An electron microscope cryotransfer holder capable of simultaneously transferring several specimens is described. A cryo-shield protects the specimens from warming or frosting during the transfer from the specimen-loading workstation into the microscope.

Abstract: A device comprising a television camera mounted inside the projection chamber of a transmission electron microscope with the imaging surface perpendicular to the optical axis of the microscope. The electron image is converted to a light image by high efficiency YAG transmission scintillator and transferred by a low loss fiber optic plate to a CCD imaging device. The camera is moved by a pneumatic piston between the operating position where it intercepts the electron beam and a position where the electron beam can pass unobstructed to the main microscope viewing screen.

Abstract: A device interposed between an electron microscope specimen holder and a microscope translation stage constructed of a special combination of materials arranged in such a manner that little or no specimen drift occurs when the temperature of the complete assembly is changed. In the first and more common arrangement, the device is placed in the nose of the standard microscope specimen holder and consists of a silica rod inside a metal tube, the material of the tube having a larger coefficient of thermal expansion than the material of the specimen rod. In the second, and less common arrangement the device is placed on the opposite side of the specimen away from the nose of the holder and consists of one tube, the material of which must have a larger coefficient of thermal expansion than the material of the specimen holder.

Abstract: An ion milling machine specimen elevator comprising a vertically oriented piston which supports a specimen holder at its top and is movable between a lowered operating position and a raised viewing position. When the piston is in the lowered operating position, it is slowly rotated about its vertical axis by a suitable drive. The elongated piston passes through an O-ring seal into an evacuated ion milling or work chamber. At the bottom of the work chamber is disposed a pneumatic control cylinder into which the piston extends. The piston can be moved up or down by altering the pressure in the pneumatic cylinder. During ion milling the piston is at its lowest position in the evacuated work chamber and is held there by pressurized gas in the pneumatic control cylinder. A second small chamber is provided above the work chamber for specimen viewing and specimen exchange.