Patents by Inventor Peter Reischig

Peter Reischig has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240219328
    Abstract: A method and system for three dimensional crystallographic grain orientation mapping for objects. In different examples. subbeams are used that interact with the object at different angles. Other options include rocking the object at different angles during a raster scan. Multiple scans can be performed including raster scanning and directed analysis. In addition, different apertures can be employed. In examples. a dispersive spectroscopy (EDS) detector is added to analysis the energy of the diffracted photons.
    Type: Application
    Filed: June 16, 2022
    Publication date: July 4, 2024
    Inventors: Christian HOLZNER, Erik Mejdal LAURIDSEN, Peter REISCHIG
  • Patent number: 11073488
    Abstract: The fingerprint comprises a three-dimensional map of internal imperfections present in a crystal within the gemstone (5), and may also comprise further information about the gemstone (5). The method comprises scanning the gemstone in an imaging apparatus by recording diffraction and/or extinction images according to a scanning strategy, and generating a fingerprint from the recorded diffraction and/or extinction images. The imaging apparatus comprises a sample holder (4), a sample stage (3), a detector (6), an x-ray source (1), wherein the sample holder (4) is movable relative to the x-ray source (1) and the detector (6). The fingerprint is used for the identification of gemstones, and/or for tracking and/or processing of gemstones in a supply chain.
    Type: Grant
    Filed: December 9, 2015
    Date of Patent: July 27, 2021
    Inventor: Peter Reischig
  • Patent number: 10288570
    Abstract: Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: May 14, 2019
    Assignee: Xnovo Technology ApS
    Inventors: Christian Wejdemann, Henning F. Poulsen, Erik M. Lauridsen, Peter Reischig
  • Publication number: 20190079032
    Abstract: Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.
    Type: Application
    Filed: November 6, 2018
    Publication date: March 14, 2019
    Inventors: Christian Wejdemann, Henning F. Poulsen, Erik M. Lauridsen, Peter Reischig
  • Patent number: 10139357
    Abstract: Disclosed is method of determining one or more unit cells of a polycrystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.
    Type: Grant
    Filed: August 4, 2016
    Date of Patent: November 27, 2018
    Assignee: Xnovo Technology ApS
    Inventors: Christian Wejdemann, Henning Friis Poulsen, Erik Mejdal Lauridsen, Peter Reischig
  • Publication number: 20170343493
    Abstract: The present invention provides a method of generating a fingerprint for a gemstone (5), for example a diamond, using x-ray imaging. The fingerprint comprises a three-dimensional map of a crystal or crystals present within the gemstone (5) including internal imperfections of the crystals and may also comprise further information about the gemstone (5).
    Type: Application
    Filed: December 9, 2015
    Publication date: November 30, 2017
    Inventor: Peter Reischig
  • Publication number: 20170038317
    Abstract: Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors . The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.
    Type: Application
    Filed: August 4, 2016
    Publication date: February 9, 2017
    Inventors: Christian Wejdemann, Henning Friis Poulsen, Erik Mejdal Lauridsen, Peter Reischig
  • Patent number: 9222901
    Abstract: An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.
    Type: Grant
    Filed: March 5, 2014
    Date of Patent: December 29, 2015
    Assignees: Danmarks Tekniske Universitet Anker Engelundsvej, CARL ZEISS X-RAY MICROSCOPY, INC.
    Inventors: Erik Mejdal Lauridsen, Stefan Othmar Poulsen, Peter Reischig
  • Publication number: 20140307854
    Abstract: An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.
    Type: Application
    Filed: March 5, 2014
    Publication date: October 16, 2014
    Applicants: CARL ZEISS X-RAY MICROSCOPY, INC., DANMARKS TEKNISKE UNIVERSITET
    Inventors: Erik Mejdal LAURIDSEN, Stefan Othmar POULSEN, Péter REISCHIG