Abstract: The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.

Abstract: The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.

Abstract: The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.

Abstract: The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.

Abstract: The present disclosure is directed to an artificial skin having a radar absorbing layer and a conductive layer containing an electrically conductive material, wherein the artificial skin has a reflection coefficient substantially equal to a human skin reflection coefficient, the human skin reflection coefficient being determined at an electromagnetic radiation frequency ranging from 1-500 GHz. A human phantom composed of the artificial skin and methods of testing the contrast resolution sufficiency of and active millimeter wave imaging system using the human phantom are also disclosed.

Abstract: The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.

Abstract: The present disclosure is directed to an artificial skin having a radar absorbing layer and a conductive layer containing an electrically conductive material, wherein the artificial skin has a reflection coefficient substantially equal to a human skin reflection coefficient, the human skin reflection coefficient being determined at an electromagnetic radiation frequency ranging from 1-500 GHz. A human phantom composed of the artificial skin and methods of testing the contrast resolution sufficiency of and active millimeter wave imaging system using the human phantom are also disclosed.

Abstract: The present disclosure is directed to an artificial skin including: a radar absorbing layer; a conductive layer comprising at least one material selected from the group consisting of a semiconductive oxide deposited onto a substrate and an electrically conductive polymer, wherein the substrate is in contact with the radar absorbing layer, and wherein the artificial skin has a reflection coefficient substantially equal to a human skin reflection coefficient, the human skin reflection coefficient being determined at an electromagnetic radiation frequency ranging from 1-500 GHz. A human phantom composed of the artificial skin and methods of using the human phantom are also disclosed.

Abstract: The present disclosure is directed to an artificial skin including: a radar absorbing layer; a conductive layer comprising at least one material selected from the group consisting of a semiconductive oxide deposited onto a substrate and an electrically conductive polymer, wherein the substrate is in contact with the radar absorbing layer, and wherein the artificial skin has a reflection coefficient substantially equal to a human skin reflection coefficient, the human skin reflection coefficient being determined at an electromagnetic radiation frequency ranging from 1-500 GHz. A human phantom composed of the artificial skin and methods of using the human phantom are also disclosed.

Abstract: The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.