Abstract: Embodiments are directed generally to an ionizing-radiation beamline monitoring system that includes a vacuum chamber structure with vacuum compatible flanges through which an incident ionizing-radiation beam enters the monitoring system. Embodiments further include at least one scintillator within the vacuum chamber structure that can be at least partially translated in the ionizing-radiation beam while oriented at an angle greater than 10 degrees to a normal of the incident ionizing-radiation beam, a machine vision camera coupled to a light-tight structure at atmospheric/ambient pressure that is attached to the vacuum chamber structure by a flange attached to a vacuum-tight viewport window with the camera and lens optical axis oriented at an angle of less than 80 degrees with respect to a normal of the scintillator, and at least one ultraviolet (“UV”) illumination source facing the scintillator in the ionizing-radiation beam for monitoring a scintillator stability comprising scintillator radiation damage.

Abstract: Embodiments are directed generally to an ionizing-radiation beamline monitoring system that includes a vacuum chamber structure with vacuum compatible flanges through which an incident ionizing-radiation beam enters the monitoring system. Embodiments further include at least one scintillator within the vacuum chamber structure that can be at least partially translated in the ionizing-radiation beam while oriented at an angle greater than 10 degrees to a normal of the incident ionizing-radiation beam, a machine vision camera coupled to a light-tight structure at atmospheric/ambient pressure that is attached to the vacuum chamber structure by a flange attached to a vacuum-tight viewport window with the camera and lens optical axis oriented at an angle of less than 80 degrees with respect to a normal of the scintillator, and at least one ultraviolet (“UV”) illumination source facing the scintillator in the ionizing-radiation beam for monitoring a scintillator stability comprising scintillator radiation damage.

Abstract: Embodiments are directed generally to an ionizing-radiation beamline monitoring system that includes a vacuum chamber structure with vacuum compatible flanges through which an incident ionizing-radiation beam enters the monitoring system. Embodiments further include at least one scintillator within the vacuum chamber structure that can be at least partially translated in the ionizing-radiation beam while oriented at an angle greater than 10 degrees to a normal of the incident ionizing-radiation beam, a machine vision camera coupled to a light-tight structure at atmospheric/ambient pressure that is attached to the vacuum chamber structure by a flange attached to a vacuum-tight viewport window with the camera and lens optical axis oriented at an angle of less than 80 degrees with respect to a normal of the scintillator, and at least one ultraviolet (“UV”) illumination source facing the scintillator in the ionizing-radiation beam for monitoring a scintillator stability comprising scintillator radiation damage.

Abstract: Embodiments are directed generally to an ionizing-radiation beamline monitoring system that includes a vacuum chamber structure with vacuum compatible flanges through which an incident ionizing-radiation beam enters the monitoring system. Embodiments further include at least one scintillator within the vacuum chamber structure that can be at least partially translated in the ionizing-radiation beam while oriented at an angle greater than 10 degrees to a normal of the incident ionizing-radiation beam, a machine vision camera coupled to a light-tight structure at atmospheric/ambient pressure that is attached to the vacuum chamber structure by a flange attached to a vacuum-tight viewport window with the camera and lens optical axis oriented at an angle of less than 80 degrees with respect to a normal of the scintillator, and at least one ultraviolet (“UV”) illumination source facing the scintillator in the ionizing-radiation beam for monitoring a scintillator stability comprising scintillator radiation damage.

Abstract: Embodiments are directed generally to an ionizing-radiation beamline monitoring system that includes a vacuum chamber structure with vacuum compatible flanges through which an incident ionizing-radiation beam enters the monitoring system. Embodiments further include at least one scintillator within the vacuum chamber structure that can be at least partially translated in the ionizing-radiation beam while oriented at an angle greater than 10 degrees to a normal of the incident ionizing-radiation beam, a machine vision camera coupled to a light-tight structure at atmospheric/ambient pressure that is attached to the vacuum chamber structure by a flange attached to a vacuum-tight viewport window with the camera and lens optical axis oriented at an angle of less than 80 degrees with respect to a normal of the scintillator, and at least one ultraviolet (“UV”) illumination source facing the scintillator in the ionizing-radiation beam for monitoring a scintillator stability comprising scintillator radiation damage.

Abstract: Embodiments are directed generally to an ionizing-radiation beamline monitoring system that includes a vacuum chamber structure with vacuum compatible flanges through which an incident ionizing-radiation beam enters the monitoring system. Embodiments further include at least one scintillator within the vacuum chamber structure that can be at least partially translated in the ionizing-radiation beam while oriented at an angle greater than 10 degrees to a normal of the incident ionizing-radiation beam, a machine vision camera coupled to a light-tight structure at atmospheric/ambient pressure that is attached to the vacuum chamber structure by a flange attached to a vacuum-tight viewport window with the camera and lens optical axis oriented at an angle of less than 80 degrees with respect to a normal of the scintillator, and at least one ultraviolet (“UV”) illumination source facing the scintillator in the ionizing-radiation beam for monitoring a scintillator stability comprising scintillator radiation damage.

Abstract: Embodiments are directed generally to an ionizing-radiation beam monitoring system that includes an enclosure structure with at least one ultra-thin window to an incident ionizing-radiation beam. Embodiments further include at least one scintillator within the enclosure structure that is substantially directly in an incident ionizing-radiation beam path and at least one ultraviolet illumination source within the enclosure structure and facing the scintillator. At least one pixelated imaging system within the enclosure structure is located out of an incident ionizing-radiation beam path and includes at least one pixelated photosensor device optically coupled to an imaging lens.

Abstract: Embodiments are directed generally to an ionizing-radiation beam monitoring system that includes an enclosure structure with at least one ultra-thin window to an incident ionizing-radiation beam. Embodiments further include at least one scintillator within the enclosure structure that is substantially directly in an incident ionizing-radiation beam path and at least one ultraviolet illumination source within the enclosure structure and facing the scintillator. At least one pixelated imaging system within the enclosure structure is located out of an incident ionizing-radiation beam path and includes at least one pixelated photosensor device optically coupled to an imaging lens.

Abstract: A transmissive ionizing-radiation beam monitoring system includes an enclosure structure with at least one ultra-thin window to an incident ionizing-radiation beam, where the ultra-thin window is highly transmissive to ionizing-radiation. Embodiments include at least one thin or ultra-thin scintillator within the enclosure structure that is substantially directly in an incident ionizing-radiation beam path and transmissive to the incident radiation beam, and at least one ultraviolet (UV) illumination source within the enclosure structure facing the scintillator. Embodiments include at least one machine vision camera within the enclosure structure located out of an incident ionizing-radiation beam path and including a camera body and lens having a projection of its optical axis oriented at an angle of incidence of 45±35 degrees to a surface of the scintillator.

Abstract: A transmissive ionizing-radiation beam monitoring system includes an enclosure structure with at least one ultra-thin window to an incident ionizing-radiation beam, where the ultra-thin window is highly transmissive to ionizing-radiation. Embodiments include at least one thin or ultra-thin scintillator within the enclosure structure that is substantially directly in an incident ionizing-radiation beam path and transmissive to the incident radiation beam, and at least one ultraviolet (UV) illumination source within the enclosure structure facing the scintillator. Embodiments include at least one machine vision camera within the enclosure structure located out of an incident ionizing-radiation beam path and including a camera body and lens having a projection of its optical axis oriented at an angle of incidence of 45±35 degrees to a surface of the scintillator.

Abstract: A transmissive ionizing-radiation beam monitoring system includes an enclosure structure including an entrance window and an exit window to an incident ionizing-radiation beam, where the entrance window and the exit window are highly transmissive. The system further includes a thin scintillator within the enclosure structure that is directly in an incident ionizing-radiation beam path and transmissive to the incident radiation beam and an ultraviolet (“UV”) illumination source within the enclosure structure facing the scintillator for internal system calibration. Embodiments further include a UV photosensor within the enclosure structure positioned to monitor and calibrate the UV illumination source and a machine vision camera within the enclosure structure that includes a lens which views the scintillator through a close proximity mirror including a folded optical axis system located to a side of the scintillator.

Abstract: A transmissive ionizing-radiation beam monitoring system includes an enclosure structure including an entrance window and an exit window to an incident ionizing-radiation beam, where the entrance window and the exit window are highly transmissive. The system further includes a thin scintillator within the enclosure structure that is directly in an incident ionizing-radiation beam path and transmissive to the incident radiation beam and an ultraviolet (“UV”) illumination source within the enclosure structure facing the scintillator for internal system calibration. Embodiments further include a UV photosensor within the enclosure structure positioned to monitor and calibrate the UV illumination source and a machine vision camera within the enclosure structure that includes a lens which views the scintillator through a close proximity mirror including a folded optical axis system located to a side of the scintillator.

Abstract: An ultra-thin radiation detector includes a radiation detector gas chamber having at least one ultra-thin chamber window and an ultra-thin first substrate contained within the gas chamber. The detector further includes a second substrate generally parallel to and coupled to the first substrate and defining a gas gap between the first substrate and the second substrate. The detector further includes a discharge gas between the substrates and contained within the gas chamber, where the discharge gas is free to circulate within the gas chamber and between the first and second substrates at a given gas pressure. The detector further includes a first electrode coupled to one of the substrates and a second electrode electrically coupled to the first electrode. The detector further includes a first discharge event detector coupled to at least one of the electrodes for detecting a gas discharge counting event in the electrode.

Abstract: An ultra-thin radiation detector includes a radiation detector gas chamber having at least one ultra-thin chamber window and an ultra-thin first substrate contained within the gas chamber. The detector further includes a second substrate generally parallel to and coupled to the first substrate and defining a gas gap between the first substrate and the second substrate. The detector further includes a discharge gas between the substrates and contained within the gas chamber, where the discharge gas is free to circulate within the gas chamber and between the first and second substrates at a given gas pressure. The detector further includes a first electrode coupled to one of the substrates and a second electrode electrically coupled to the first electrode. The detector further includes a first discharge event detector coupled to at least one of the electrodes for detecting a gas discharge counting event in the electrode.

Abstract: A position-sensitive ionizing-particle radiation counting detector includes a first substrate and a second substrate generally parallel to the first substrate and forming a gap with the first substrate, with a discharge gas contained within the gap. The detector includes a first electrode electrically coupled to the second substrate, and a second electrode electrically coupled to the first electrode and defining at least one pixel with the first electrode. The detector further includes an open dielectric structure pattern layered over one of the first or second electrodes and a current-limiting quench resistor coupled in series to one of the first or second electrodes. The detector further includes a power supply coupled to one of the first or second electrodes and a first discharge event detector circuitry coupled to the one of the first or second electrodes for detecting a gas discharge counting event in the electrode.

Abstract: A position-sensitive ionizing-particle radiation counting detector includes a first substrate and a second substrate generally parallel to the first substrate and forming a gap with the first substrate, with a discharge gas contained within the gap. The detector includes a first electrode electrically coupled to the second substrate, and a second electrode electrically coupled to the first electrode and defining at least one pixel with the first electrode. The detector further includes an open dielectric structure pattern layered over one of the first or second electrodes and a current-limiting quench resistor coupled in series to one of the first or second electrodes. The detector further includes a power supply coupled to one of the first or second electrodes and a first discharge event detector circuitry coupled to the one of the first or second electrodes for detecting a gas discharge counting event in the electrode.

Abstract: A position-sensitive ionizing-radiation counting detector includes a radiation detector gas chamber having at least one ultra-thin chamber window and an ultra-thin first substrate contained within the gas chamber. The detector further includes a second substrate generally parallel to and coupled to the first substrate and defining a gas gap between the first substrate and the second substrate. The detector further includes a discharge gas between the substrates and contained within the gas chamber, where the discharge gas is free to circulate within the gas chamber and between the first and second substrates at a given gas pressure. The detector further includes a first electrode coupled to one of the substrates and a second electrode electrically coupled to the first electrode. The detector further includes a first discharge event detector coupled to at least one of the electrodes for detecting a gas discharge counting event in the electrode.

Abstract: An apparatus includes a first layer of a rare earth element. The apparatus further includes a thin-film coating layer deposited on the first layer, where the thin-film coating layer includes boron.

Abstract: A position-sensitive ionizing-radiation counting detector includes a first substrate and a second substrate, and a defined gas gap between the first substrate and the second substrate. The first and second substrates comprise dielectrics and a discharge gas is contained between the first and second substrate. A microcavity structure comprising microcavities is coupled to the second substrate. An anode electrode is coupled to the first substrate and a cathode electrode is coupled to the microcavity structure on the second substrate. The detector further includes pixels defined by a microcavity and an anode electrode coupled to a cathode electrode, and a resistor coupled to each of the cathode electrodes. Each pixel may output a gas discharge counting event pulse upon interaction with ionizing-radiation. The detector further includes a voltage bus coupled to each of the resistors and a power supply coupled to at least one of the electrodes.

Abstract: A position-sensitive ionizing-radiation counting detector includes a radiation detector gas chamber having at least one ultra-thin chamber window and an ultra-thin first substrate contained within the gas chamber. The detector further includes a second substrate generally parallel to and coupled to the first substrate and defining a gas gap between the first substrate and the second substrate. The detector further includes a discharge gas between the substrates and contained within the gas chamber, where the discharge gas is free to circulate within the gas chamber and between the first and second substrates at a given gas pressure. The detector further includes a first electrode coupled to one of the substrates and a second electrode electrically coupled to the first electrode. The detector further includes a first discharge event detector coupled to at least one of the electrodes for detecting a gas discharge counting event in the electrode.