Abstract: An apparatus or method for calibrating a battery emulator is proposed. The battery emulator emulates a plurality of cells connected in series, wherein each emulated cell has taps over which at least one emulated quantity is tapped, wherein the apparatus comprises a switching apparatus via which a calibration standard is switchably connectable with different taps.

Abstract: An apparatus for testing an electrical component, having a simulation unit for producing a simulation signal, a plurality of test units, and at least one electrical connecting device, whereby the simulation unit and the plurality of test units are connected or connectable to each other in an electrically conductive fashion via the at least one connecting device, and the at least one connecting device has at least one electrical switch device, which is situated to make or break an electrical connection between the plurality of test units.

Abstract: An apparatus for testing an electrical component, having a simulation unit for producing a simulation signal, a plurality of test units, and at least one electrical connecting device, whereby the simulation unit and the plurality of test units are connected or connectable to each other in an electrically conductive fashion via the at least one connecting device, and the at least one connecting device has at least one electrical switch device, which is situated to make or break an electrical connection between the plurality of test units.

Abstract: A device for testing an electrical component is provided, having a simulation device for generating a simulation signal, a testing device for connecting the electrical component, at least two connecting devices, and a selection device for selecting the connecting device, wherein the simulation device and the testing device can be connected in an electrically conducting manner to at least one of the connecting devices by the selection device and the individual connecting devices differ from one another in at least one electrical property. Thus, a device for testing an electrical component is provided with which in a simple manner the testing accuracy can be increased by minimizing the signal corruption due to a parasitic property of the connecting device.

Abstract: The patent deals with a contact fixture for a PCB with one first plug-in connector and one second plug-in connector, whereby the first plug-in connector has a number of first contact elements, the second plug-in connector has a number of second contact elements, the first plug-in connector is arranged on the first side of the PCB, the second plug-in connector is arranged on the second side of the PCB opposite to the first side, the first contact element and/or the second contact element is/are designed as a connector to establish a detachable electrically conductive connection with at least the second contact element or the first contact element, and the first contact element and the second contact element are connected through an opening in the PCB.

Abstract: The patent deals with a contact fixture for a PCB with one first plug-in connector and one second plug-in connector, whereby the first plug-in connector has a number of first contact elements, the second plug-in connector has a number of second contact elements, the first plug-in connector is arranged on the first side of the PCB, the second plug-in connector is arranged on the second side of the PCB opposite to the first side, the first contact element and/or the second contact element is/are designed as a connector to establish a detachable electrically conductive connection with at least the second contact element or the first contact element, and the first contact element and the second contact element are connected through an opening in the PCB.

Abstract: A device for testing an electrical component is provided, having a simulation device for generating a simulation signal, a testing device for connecting the electrical component, at least two connecting devices, and a selection device for selecting the connecting device, wherein the simulation device and the testing device can be connected in an electrically conducting manner to at least one of the connecting devices by the selection device and the individual connecting devices differ from one another in at least one electrical property. Thus, a device for testing an electrical component is provided with which in a simple manner the testing accuracy can be increased by minimizing the signal corruption due to a parasitic property of the connecting device.